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A VLSI DIGITAL TESTER BASED UPON A SINGLE CUSTOM CHIP PER INDIVIDUAL PIN

Award Information

Agency:
National Aeronautics and Space Administration 		Branch:
N/A 		Award ID:
5119 		Program Year/Program:
1987 / SBIR
Agency Tracking Number:
5119 		Solicitation Year:
N/A 		Solicitation Topic Code:
N/A 		Solicitation Number:
N/A
Small Business Information
BONNEVILLE SCIENTIFIC, INC.
P.O. Box 9497 Salt Lake City, UT 84109
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Woman-Owned: No
Minority-Owned: No
HUBZone-Owned: No
 
Phase 1
Fiscal Year: 1987
Title: A VLSI DIGITAL TESTER BASED UPON A SINGLE CUSTOM CHIP PER INDIVIDUAL PIN
Agency: NASA
Contract: N/A
Award Amount: $50,000.00
 

Abstract:

IN THIS PHASE I, SIX-MONTH FEASIBILITY STUDY WE PROPOSE TO GENERATE A PLAN FOR A SYSTEM ARCHITECTURE FOR A DIGITAL VLSI CHIP TESTER. THE TESTER WILL BE DESIGNED TO INTERFACE TO THE DESIGN WORKSTATION TO ALLOW INTERACTIVE DEBUGGING OF PROTOTYPE CIRCUITS AND SUBSEQUENT DOWN LOADING OF TEST PATTERNS AND EXPECTED RESULTS TO A PRODUCTION VLSI TESTER. THE TESTER WILL BE LOW IN COST BECAUSE IT WILL NOT PERFORM ANALOG TESTING AND BECAUSE EACH INDIVIDUAL PIN OF THE DEVICE UNDER TEST WILL BE DIRECTLY TESTED BY A DEDICATED TESTING INTEGRATED CIRCUIT. THE FUNCTIONAL DESIGN OF THIS TESTING CHIP WILL BE GENERATED, THE CIRCUIT WILL BE COMPLETELY DESIGNED USING PATH PROGRAMMABLE LOGIC, AND IT WILL BE SIMULATED DURING PHASE I. THE CHIP WILL BE FABRICATED AND THE COMPLETE TESTER SYSTEM (HARDWARE AND SOFTWARE) WILL BE COMPLETED IN PHASE II.

Principal Investigator:


0

Business Contact:

Allen R. Grahn
Investigator
Small Business Information at Submission:

Bonneville Scientific Inc
918 East 900 South Salt Lake City, UT 84105

EIN/Tax ID:
DUNS: N/A
Number of Employees: N/A
Woman-Owned: No
Minority-Owned: No
HUBZone-Owned: No