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Company Information:

Company Name:
4 D TECHNOLOGY CORPORATION
Address:
3280 E. HEMISPHERE LOOP
SUITE 146
TUCSON, AZ 85706
Phone:
N/A
URL:
N/A
EIN:
800004529
DUNS:
111037482
Number of Employees:
36
Woman-Owned?:
No
Minority-Owned?:
No
HUBZone-Owned?:
No

Award Totals:

Program/Phase Award Amount ($) Number of Awards
SBIR Phase I $357,275.00 3
SBIR Phase II $999,013.00 1

Award List:

Dynamic Phase Imaging Interference 4D Microscope System

Award Year / Program / Phase:
2010 / SBIR / Phase I
Award Amount:
$107,275.00
Agency:
HHS
Principal Investigator:
Abstract:
DESCRIPTION (provided by applicant): We propose to develop a dynamic quantitative phase-imaging interference 4D microscope system operating in reflection to enable creating phase image movies and quantifying motion of live cells and cellular processes in v itro without the need for adding contrast… More

SBIR Phase I:Dynamic Surface Profile Measurement System

Award Year / Program / Phase:
2010 / SBIR / Phase I
Award Amount:
$150,000.00
Agency:
NSF
Principal Investigator:
James E. Millerd, PhD – (520) 294-5600
Abstract:
This Small Business Innovation Research (SBIR) Phase I project addresses the metrology needs of next-generation manufacturing of precision components by developing a surface measuring microscope with extended vertical range/slope capability that can operate under extreme vibration conditions. The… More

Dynamic Phase Imaging Interference 4D Microscope System

Award Year / Program / Phase:
2011 / SBIR / Phase II
Award Amount:
$999,013.00
Agency:
HHS
Principal Investigator:
James E. Millerd – 520-294-5600
Abstract:
DESCRIPTION (provided by applicant): This project will develop a dynamic quantitative phase-imaging interference 4D microscope system to enable creating phase image movies and quantifying motion of live cells and cellular processes in vitro using harmlesslight levels without the need for adding… More

In-Situ Extended Lateral Range Surface Metrology

Award Year / Program / Phase:
2011 / SBIR / Phase I
Award Amount:
$100,000.00
Agency:
NASA
Principal Investigator:
Katherine Creath, Principal Investigator – (520) 294-5600
Abstract:
We propose to develop an extended lateral range capability for a dynamic optical profiling system to enable non-contact, surface roughness measurement of large and aspheric astronomical optics in-situ during manufacture. This instrument will be capable of measuring more than three decades of… More