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Company Information:

Company Name: Celadon Systems Inc.
City: Apple Valley
State: MN
Zip+4: 55124
Woman-Owned: No
Minority-Owned: No
HUBZone-Owned: No
Website URL: N/A
Phone: N/A

Award Totals:

Program/Phase Award Amount ($) Number of Awards
SBIR Phase I $90,000.00 1
SBIR Phase II $300,000.00 1

Award List:

300 mm High Density Temperature Probe Card for Wafer- Level Reliability Testing

Award Year / Program / Phase: 2010 / SBIR / Phase I
Agency / Branch: DOC / NIST
Principal Investigator: Bryan Root
Award Amount: $90,000.00
Abstract:
Historical methods of reliability assessment are less and less effective as device sizes shrink. Already researchers are unable to package the many advanced devices because the act of cutting the wafer and the packaging operation pre-stresses or destroys the devices resulting in unreliable test… More

Massively Parallel High Temperature Probe System for Wafer-level Reliability Testing

Award Year / Program / Phase: 2011 / SBIR / Phase II
Agency / Branch: DOC / NIST
Principal Investigator: Jon Dunklee – (503) 505-0247
Award Amount: $300,000.00
Abstract:
Historical methods of reliability assessment are less and less effective as device sizes shrink. Larger sample sizes and longer duration tests are increasingly needed. At the same time, efforts to continue scaling semiconductors to ever smaller geometries is leading to an explosion of new device… More