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Automated Generation of Advanced Test Diagrams to Reduce Test Program Set…

Award Information

Agency:
Department of Defense
Branch:
Navy
Award ID:
98375
Program Year/Program:
2010 / SBIR
Agency Tracking Number:
N101-029-2230
Solicitation Year:
N/A
Solicitation Topic Code:
NAVY 10-029
Solicitation Number:
N/A
Small Business Information
Summit Test Solutions
4266 Linda Vista Dr. Fallbrook, CA -
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Woman-Owned: No
Minority-Owned: No
HUBZone-Owned: No
 
Phase 1
Fiscal Year: 2010
Title: Automated Generation of Advanced Test Diagrams to Reduce Test Program Set Life-Cycle Costs
Agency / Branch: DOD / NAVY
Contract: N68335-10-C-0295
Award Amount: $78,525.00
 

Abstract:

The objective of this proposal and the proposed research project is to investigate the feasibility of developing a process and associated tools to generate wiring test diagrams automatically using data compliant with the Institute of Electrical and Electronics Engineers (IEEE) Automatic Test Markup Language (ATML) family of standards. Test diagrams show the routing of signals for each test in an automatic test program which tests a Unit Under Test (UUT) from an avionics system or other weapon system on an Automatic Test Equipment (ATE). The test diagrams provide the complete routing of signals from test station instruments to UUT and are a key support document, useful throughout the life cycle of the Test Program Set (TPS). Automated processes for test diagram generation promise to decrease the lengthy time to generate them by eliminating many hours of analysis of test stations, test programs and associated interface hardware. The proposed solution should also enhance the update process and eliminate errors and inconsistencies typical of manually generated diagrams. Relying on the ATML standards for the format of data in this process is a key component of this proposal and will provide a much desired open systems approach.

Principal Investigator:

Ronald Taylor
Chief Technologist
7603105916
ron.taylor@summittests.com

Business Contact:

Ronald Taylor
Chief Technologist
7603105916
ron.taylor@summittests.com
Small Business Information at Submission:

Summit Test Solutions
4266 Linda Vista Dr. Fallbrook, CA 92028

EIN/Tax ID: 760757340
DUNS: N/A
Number of Employees:
Woman-Owned: No
Minority-Owned: No
HUBZone-Owned: No