USA flag logo/image

An Official Website of the United States Government

Growth, Evaluation And Modeling Of High Tc Superconducting Multilayer Structures

Award Information

Agency:
Department of Defense
Branch:
Defense Advanced Research Projects Agency
Award ID:
19730
Program Year/Program:
1993 / SBIR
Agency Tracking Number:
19730
Solicitation Year:
N/A
Solicitation Topic Code:
N/A
Solicitation Number:
N/A
Small Business Information
Excel Superconductors, Inc.
140-29 Keyland Court Bohemia, NY 11716
View profile »
Woman-Owned: No
Minority-Owned: Yes
HUBZone-Owned: No
 
Phase 1
Fiscal Year: 1993
Title: Growth, Evaluation And Modeling Of High Tc Superconducting Multilayer Structures
Agency / Branch: DOD / DARPA
Contract: N/A
Award Amount: $50,000.00
 

Abstract:

Residual stress in thin-film materials resulting from thermal and chemical strains is a continuing problem in the synthesis of superconducting thin films. The probelm exists not only in the superconducting layers, but also in the dielectric layer used as a buffer. Models that can analyze and predict the film stresses and accompanying mechanical failure are extremely useful as a starting point in the design of a multilayer circuit. The present program jointly proposed by Excel Superconductor, Inc. and North Carolina State University addresses this need. Computer modeling of typical multilayer structures containing superconducting thin films, dielectric layers and metal layers will be model as well as provide feed back information to improve the model. The proposed research will enable us to determine the key factors responsible for the stresses developed in the processing of the films, mode of failure of the films by introduction of flaws and voids. This information will forecase the success of any particular HTS based thin-film device. In Phase I such a study will be carried out for TBCO/LaA103 and metal/TBCO/YSZ/Si systems, issues for Phase II will be identified for the use of the model for other systems. ANTICIPATED BENEFITS: When fully developed, the model could predict the mechanical performance of multilayer thin-film structures in a particular geometry. This will aid the selection of mechanically correct circuit designs suitable for any particular application like semiconductor interconnects, SQUIDS and hybrid electronic circuits.

Principal Investigator:

L. Ganapathi
5165638278

Business Contact:

Small Business Information at Submission:

Excel Superconductor, Inc.
14029 Keyland Ct. Bohemia, NY 11716

EIN/Tax ID:
DUNS: N/A
Number of Employees:
Woman-Owned: No
Minority-Owned: No
HUBZone-Owned: No