USA flag logo/image

An Official Website of the United States Government

Development of Tin Whisker Growth Model Using the Faradayic Process

Award Information

Agency:
Department of Defense 		Branch:
Office of the Secretary of Defense 		Award ID:
91345 		Program Year/Program:
2009 / SBIR
Agency Tracking Number:
O083-M04-2012 		Solicitation Year:
N/A 		Solicitation Topic Code:
N/A 		Solicitation Number:
N/A
Small Business Information
Faraday Technology, Inc.
315 Huls Drive Clayton, OH -
View profile »
Woman-Owned: No
Minority-Owned: No
HUBZone-Owned: No
 
Phase 1
Fiscal Year: 2009
Title: Development of Tin Whisker Growth Model Using the Faradayic Process
Agency / Branch: DOD / OSD
Contract: W31P4Q-09-C-0619
Award Amount: $100,000.00
 

Abstract:

The recent European Union ROHS Directive for the elimination of lead from tin-lead solders in electronics products has lead the industry scrambling for alternatives not affected by tin whisker growth. Tin whiskers spontaneously grow on pure tin and tin-rich alloy surfaces, and may cause reliability and performance issues such as shorting and metal-vapor arcing, which lead to device failure. It is generally acknowledged that a number of factors influence whisker formation/growth: intrinsic stress in the electrodeposit, extrinsic stress resulting from chemical reactions between the tin deposit and substrate, purity of the tin deposit, grain size and crystallographic orientation of the tin deposit, pre-plate chemical treatment of the substrate, tin deposit plating thickness, post-plate heat treatment and storage and operating conditions. A mechanism of how these parameters interact is the key to understanding the formation/growth of whiskers. Faraday Technology proposes to gain fundamental knowledge of how the properties of the electrodeposits influence whiskering propensity with the Faradayic Process, for control of deposit properties and consequent performance of pure tin electrodeposits. This technology enables correlation between deposit properties and whiskering propensity of pure tin deposits in order to establish a tin whisker growth model and accelerated testing regime.

Principal Investigator:

Holly Garich
Project Engineer
9378367749
hollygarich@faradaytechnology.com

Business Contact:

E. Jennings Taylor
Vice President
9378367749
jenningstaylor@faradaytechnology.co
Small Business Information at Submission:

FARADAY TECHNOLOGY, INC.
315 Huls Drive Clayton, OH 45315

EIN/Tax ID: 311347918
DUNS: N/A
Number of Employees:
Woman-Owned: No
Minority-Owned: No
HUBZone-Owned: No