Fiscal Year:
1989
Title:
APPLICATION OF THE SCANNING TUNNELING MICROSCOPE FOR NON-CONTACT TESTING OF HGCDTE DIODES
Agency / Branch:
DOD / ARMY
Contract:
N/A
Award Amount:
$617,405.00
Abstract:
A NOVEL METHOD FOR NON-CONTACT, NON-INVASIVE IN-SITU PHOTODIODE EVALUATION ON THE WAFER IS PROPOSED. THE PROPOSED METHOD IS BASED ON A MODIFIED FORM OF THE SCANNING TUNNELING MICROSCOPE (STM). ALTHOUGH PRIMARILY A TOOL FOR MATERIALS SURFACE RESEARCH, WE BELIEVE THE TECHNIQUE CAN BE ADAPTED TO MEASURE CURRENT THROUGH THE DIODE VIA TUNNELING FROM THE PROBE TIP TO THE CONTACTIVE PADS OF THE DIODES. IN CONJUNCTION WITH AN OPTICAL PROBE BEAM, THE RESPONSIVITY AT DIFFERENT WAVELENGTH AS WELL AS THE I-V CHARACTERISTIC CAN BE MEASURED.
Principal Investigator:
Dr Horacio Verdun
7034717671
Business Contact:
Small Business Information at Submission:
Fibertek Inc.
510-a Herndon Pkwy Herndon, VA 22070
EIN/Tax ID:
DUNS:
N/A
Number of Employees:
Woman-Owned:
No
Minority-Owned:
No
HUBZone-Owned:
No