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A Digital SQIOD Instrument for High-Precision Particle Beam Current Measurement

Award Information
Agency: Department of Energy
Branch: N/A
Contract: N/A
Agency Tracking Number: 55748
Amount: $100,000.00
Phase: Phase I
Program: SBIR
Solicitation Topic Code: 18d
Solicitation Number: N/A
Timeline
Solicitation Year: N/A
Award Year: 1999
Award Start Date (Proposal Award Date): N/A
Award End Date (Contract End Date): N/A
Small Business Information
175 Clearbrook Road
Elmsford, NY 10523
United States
DUNS: N/A
HUBZone Owned: No
Woman Owned: No
Socially and Economically Disadvantaged: No
Principal Investigator
Business Contact
Research Institution
N/A
Abstract

The Navy has demonstrated a need for technologies to address the testability and certification of complex software-intensive applications/systems within a total ship computing environment. Viatec Research proposes to determine the feasibility of developing a set of accurate risk-based software testing and reliability predictors and guides that are based on our award winning Resource Constrained Testing (RCT) methodologies. Our goals are to develop methods, metrics, process enablers, heuristics and models to be applied in COTS Integrated distributed software intensive systems. We propose to demonstrate how our methodologies will be used to guide the software testing process, assess the testability of software, identify which software items may be problem prone, and certify the availability and reliability in terms of functionality and real time response of a software system. Our RCT Testing-Efficiency (TE) metric will allow construction of fault-rate performance graphs that demonstrate whether a testing process is performing as expected. Our RCT residual fault-models will estimate the number of faults expected during operational use (e.g., in the next two years). Our RCT technology already has been successful in forecasting field quality and providing testing process decision support using real data from complex tele- and data communications software intensive systems.

* Information listed above is at the time of submission. *

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