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HIGH RESOLUTION SCANNING RF PROBE FOR SEMICONDUCTOR ELECTRICCONDUCTIVITY…

Award Information

Agency:
National Science Foundation 		Branch:
N/A 		Award ID:
5233 		Program Year/Program:
1987 / SBIR
Agency Tracking Number:
5233 		Solicitation Year:
N/A 		Solicitation Topic Code:
N/A 		Solicitation Number:
N/A
Small Business Information
InterScience, Inc.
105 Jordan Road Troy, NY -
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Woman-Owned: No
Minority-Owned: No
HUBZone-Owned: No
 
Phase 1
Fiscal Year: 1987
Title: HIGH RESOLUTION SCANNING RF PROBE FOR SEMICONDUCTOR ELECTRICCONDUCTIVITY MEASUREMENTS
Agency: NSF
Contract: N/A
Award Amount: $40,000.00
 

Abstract:

ELECTRIC CONDUCTIVITY AND EXCESS CARRIER LIFETIME ARE TWO OFTHE MOST IMPORTANT PARAMETERS THAT DETERMINE THE PERFORMANCEOF SEMICONDUCTOR MATERIALS FOR APPLICATION AS PHOTODETECTORS. THE ABILITY TO OBTAIN NON-DESTRUCTIVE, HIGH RESOLUTION MEASUREMENTS OF THESE CHARACTERISTICS IS ONEOF THE BASIC PROBLEMS IN THE DEVELOPMENT AND FABRICATION OF SUCH MATERIALS. A TECHNIQUE TO MEASURE THE CONDUCTIVITY BASED ON SCANNING THE SAMPLES WITH A RF PROBE CAPABLE OF SPATIAL RESOLUTION OF A FEW MICRONS IS PROPOSED. BY MEASURING THE DECAY OF THE CONDUCTIVITY FOLLOWING EXCITATION BY A LIGHT PULSE, THE EXCESS CARRIER LIFETIME CAN ALSO BE DETERMINED. A PROGRAM TO DETERMINE THE LIMITINGSENSITIVITY AND RESOLUTION BY TWO VARIATIONS OF THE BASIC APPROACH IS PROPOSED FOR THE PHASE I EFFORT.

Principal Investigator:


0

Business Contact:

James T. Woo
President
Small Business Information at Submission:

Interscience Inc.
105 Jordan Rd Troy, NY 12180

EIN/Tax ID:
DUNS: N/A
Number of Employees: N/A
Woman-Owned: No
Minority-Owned: No
HUBZone-Owned: No