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Company Information:

Company Name: J. A. Woollam Co., Inc.
City: Lincoln
State: NE
Zip+4: 68508
Woman-Owned: No
Minority-Owned: No
HUBZone-Owned: No
Website URL: N/A
Phone: (402) 477-7501

Award Totals:

Program/Phase Award Amount ($) Number of Awards
SBIR Phase I $359,999.00 6
SBIR Phase II $2,095,674.00 5
STTR Phase I $99,993.00 1
STTR Phase II $749,183.00 1

Award List:

ELECTRON CYCLOTRON RESONANCE (ECR) SEMICONDUCTOR ETCHING PROCESS CONTROL BY ELLIPSOMETRY

Award Year / Program / Phase: 1992 / SBIR / Phase I
Agency / Branch: DOD / ARMY
Principal Investigator: Blaine Johs
Award Amount: $50,000.00

REAL TIME SPACE MATERIALS DEGRADATION MONITOR USING ELLISPSOMETER

Award Year / Program / Phase: 1992 / SBIR / Phase I
Agency: NASA
Principal Investigator: Blaine Johs
Award Amount: $50,000.00

REAL TIME MONITOR AND CONTROL OF MBE GROWTH OF HGCDTE BY SPECTROSCOPIC ELLIOPSOMETRY

Award Year / Program / Phase: 1992 / SBIR / Phase I
Agency / Branch: DOD / ARMY
Principal Investigator: Blaine Johs
Award Amount: $50,000.00

ELECTRON CYCLOTRON RESONANCE (ECR) SEMICONDUCTOR ETCHING PROCESS CONTROL BY ELLIPSOMETRY

Award Year / Program / Phase: 1993 / SBIR / Phase II
Agency / Branch: DOD / ARMY
Principal Investigator: Blaine Johs
Award Amount: $341,980.00
Abstract:
The need for smaller semiconductor device structures for use in very high speed microelectronics requires a new generation of plasma etching technology. ecr promises to provide features as small as 0.2 microns in size, as well as a high degree of etching anisotropy, selectivity, etch rates, and low… More

REAL TIME MONITOR AND CONTROL OF MBE GROWTH OF HGCDTE BY SPECTROSCOPIC ELLIOPSOMETRY

Award Year / Program / Phase: 1993 / SBIR / Phase II
Agency / Branch: DOD / ARMY
Principal Investigator: Blaine Johs
Award Amount: $489,495.00
Abstract:
Ii-vi semiconductors, especially hgcdte, are used extensively in infrared imaging and night vision electronics. these semiconductors have soft surfaces; growth of device quality material is difficult; device yields are low, and costs are high. there is thus a great need for non-invasive process… More

REAL TIME SPACE MATERIALS DEGRADATION MONITOR USING ELLISPSOMETER

Award Year / Program / Phase: 1993 / SBIR / Phase II
Agency: NASA
Principal Investigator: Blaine Johs
Award Amount: $474,199.00

Electrically Conductive, Atomic Oxygen Protective Coatings for Space Power Systems

Award Year / Program / Phase: 1993 / SBIR / Phase I
Agency: NASA
Principal Investigator: Duane E. Meyer
Award Amount: $50,000.00

Spacecraft Thermal Control Management Using Electrochromics

Award Year / Program / Phase: 1997 / SBIR / Phase I
Agency / Branch: DOD / MDA
Principal Investigator: David Hoylman
Award Amount: $60,000.00
Abstract:
Thermal control of a space satellite in orbit is usually accomplished by balancing the energy emitted by the satellite as infrared radiation against the energy dissipated by internal electrical (and other) sources plus energy absorbed from the environment. Due to changing conditions as the satellite… More

Spacecraft Thermal Control Management Using Electrochromics

Award Year / Program / Phase: 1998 / SBIR / Phase II
Agency / Branch: DOD / MDA
Principal Investigator: David Hoylman
Award Amount: $390,000.00
Abstract:
Thermal control of a space satellite in orbit is usually accomplished by balancing the energy emitted by the satellite as infrared radiation against the energy dissipated by internal electrical (and other) sources plus energy absorbed from the environment. Due to changing conditions as the satellite… More

SBIR Phase I: Infrared Spectroscopic Ellipsometry

Award Year / Program / Phase: 1998 / SBIR / Phase I
Agency: NSF
Principal Investigator: Ping He
Award Amount: $99,999.00

N/A

Award Year / Program / Phase: 1999 / SBIR / Phase II
Agency: NSF
Principal Investigator: Ping He
Award Amount: $400,000.00

Terahertz Ellipsometry for Reflection-Mode Material Characterization

Award Year / Program / Phase: 2008 / STTR / Phase I
Agency / Branch: DOD / ARMY
Research Institution: UNIV. OF NEBRASKA-LINCOLN
Principal Investigator: Craig M. Herzinger, Research Scientist
Award Amount: $99,993.00
RI Contact: Suzan G. Lund
Abstract:
As technologies utilizing THz radiation (light) are developed, the optical properties for many materials need to be determined accurately as a function of frequency. In a security screening system, measured optical properties might be used to distinguish, independent of shape, between threat and… More

Terahertz Ellipsometry for Reflection-Mode Material Characterization

Award Year / Program / Phase: 2009 / STTR / Phase II
Agency / Branch: DOD / ARMY
Research Institution: University of Nebraska-Lincoln
Principal Investigator: Craig M. Herzinger, Research Scientist
Award Amount: $749,183.00
RI Contact: Suzan G. Lund
Abstract:
As technologies utilizing THz radiation (light) develop, the optical properties for many materials need to be determined accurately as a function of frequency in a variety of applications including: THz threat detection and security screening applications