Award Year / Program / Phase:
1993 / SBIR / Phase II
Agency / Branch:
DOD / ARMY
Principal Investigator:
Blaine Johs
Award Amount:
$341,980.00
Abstract:
The need for smaller semiconductor device structures for use in very high speed microelectronics requires a new generation of plasma etching technology. ecr promises to provide features as small as 0.2 microns in size, as well as a high degree of etching anisotropy, selectivity, etch rates, and low…
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Award Year / Program / Phase:
1993 / SBIR / Phase II
Agency / Branch:
DOD / ARMY
Principal Investigator:
Blaine Johs
Award Amount:
$489,495.00
Abstract:
Ii-vi semiconductors, especially hgcdte, are used extensively in infrared imaging and night vision electronics. these semiconductors have soft surfaces; growth of device quality material is difficult; device yields are low, and costs are high. there is thus a great need for non-invasive process…
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Award Year / Program / Phase:
1998 / SBIR / Phase II
Agency / Branch:
DOD / MDA
Principal Investigator:
David Hoylman
Award Amount:
$390,000.00
Abstract:
Thermal control of a space satellite in orbit is usually accomplished by balancing the energy emitted by the satellite as infrared radiation against the energy dissipated by internal electrical (and other) sources plus energy absorbed from the environment. Due to changing conditions as the satellite…
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Award Year / Program / Phase:
2008 / STTR / Phase I
Agency / Branch:
DOD / ARMY
Research Institution:
UNIV. OF NEBRASKA-LINCOLN
Award Amount:
$99,993.00
RI Contact:
Suzan G. Lund
Abstract:
As technologies utilizing THz radiation (light) are developed, the optical properties for many materials need to be determined accurately as a function of frequency. In a security screening system, measured optical properties might be used to distinguish, independent of shape, between threat and…
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Award Year / Program / Phase:
2009 / STTR / Phase II
Agency / Branch:
DOD / ARMY
Research Institution:
University of Nebraska-Lincoln
Award Amount:
$749,183.00
RI Contact:
Suzan G. Lund
Abstract:
As technologies utilizing THz radiation (light) develop, the optical properties for many materials need to be determined accurately as a function of frequency in a variety of applications including: THz threat detection and security screening applications