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Company Information:

Company Name:
J. A. Woollam Co., Inc.
Address:
645 M Street, Suite 102
Lincoln, NE 68508
Phone:
(402) 477-7501
URL:
N/A
EIN:
470762914
DUNS:
175330976
Number of Employees:
42
Woman-Owned?:
No
Minority-Owned?:
No
HUBZone-Owned?:
No

Commercialization:

Has been acquired/merged with?:
N/A
Has had Spin-off?:
N/A
Has Had IPO?:
N/A
Year of IPO:
N/A
Has Patents?:
N/A
Number of Patents:
N/A
Total Sales to Date $:
$ 0.00
Total Investment to Date $
$ 0.00
POC Title:
N/A
POC Name:
N/A
POC Phone:
N/A
POC Email:
N/A
Narrative:
N/A

Award Totals:

Program/Phase Award Amount ($) Number of Awards
SBIR Phase I $359,999.00 6
SBIR Phase II $2,095,674.00 5
STTR Phase I $99,993.00 1
STTR Phase II $749,183.00 1

Award List:

ELECTRON CYCLOTRON RESONANCE (ECR) SEMICONDUCTOR ETCHING PROCESS CONTROL BY ELLIPSOMETRY

Award Year / Program / Phase:
1992 / SBIR / Phase I
Award Amount:
$50,000.00
Agency / Branch:
DOD / ARMY
Principal Investigator:
Blaine Johs
Abstract:
N/a

REAL TIME SPACE MATERIALS DEGRADATION MONITOR USING ELLISPSOMETER

Award Year / Program / Phase:
1992 / SBIR / Phase I
Award Amount:
$50,000.00
Agency:
NASA
Principal Investigator:
Blaine Johs
Abstract:
N/a

REAL TIME MONITOR AND CONTROL OF MBE GROWTH OF HGCDTE BY SPECTROSCOPIC ELLIOPSOMETRY

Award Year / Program / Phase:
1992 / SBIR / Phase I
Award Amount:
$50,000.00
Agency / Branch:
DOD / ARMY
Principal Investigator:
Blaine Johs
Abstract:
N/a

ELECTRON CYCLOTRON RESONANCE (ECR) SEMICONDUCTOR ETCHING PROCESS CONTROL BY ELLIPSOMETRY

Award Year / Program / Phase:
1993 / SBIR / Phase II
Award Amount:
$341,980.00
Agency / Branch:
DOD / ARMY
Principal Investigator:
Blaine Johs
Abstract:
The need for smaller semiconductor device structures for use in very high speed microelectronics requires a new generation of plasma etching technology. ecr promises to provide features as small as 0.2 microns in size, as well as a high degree of etching anisotropy, selectivity, etch rates, and low… More

REAL TIME MONITOR AND CONTROL OF MBE GROWTH OF HGCDTE BY SPECTROSCOPIC ELLIOPSOMETRY

Award Year / Program / Phase:
1993 / SBIR / Phase II
Award Amount:
$489,495.00
Agency / Branch:
DOD / ARMY
Principal Investigator:
Blaine Johs
Abstract:
Ii-vi semiconductors, especially hgcdte, are used extensively in infrared imaging and night vision electronics. these semiconductors have soft surfaces; growth of device quality material is difficult; device yields are low, and costs are high. there is thus a great need for non-invasive process… More

REAL TIME SPACE MATERIALS DEGRADATION MONITOR USING ELLISPSOMETER

Award Year / Program / Phase:
1993 / SBIR / Phase II
Award Amount:
$474,199.00
Agency:
NASA
Principal Investigator:
Blaine Johs
Abstract:
N/a

Electrically Conductive, Atomic Oxygen Protective Coatings for Space Power Systems

Award Year / Program / Phase:
1993 / SBIR / Phase I
Award Amount:
$50,000.00
Agency:
NASA
Principal Investigator:
Duane E. Meyer
Abstract:
N/a

Spacecraft Thermal Control Management Using Electrochromics

Award Year / Program / Phase:
1997 / SBIR / Phase I
Award Amount:
$60,000.00
Agency / Branch:
DOD / MDA
Principal Investigator:
David Hoylman
Abstract:
Thermal control of a space satellite in orbit is usually accomplished by balancing the energy emitted by the satellite as infrared radiation against the energy dissipated by internal electrical (and other) sources plus energy absorbed from the environment. Due to changing conditions as the satellite… More

Spacecraft Thermal Control Management Using Electrochromics

Award Year / Program / Phase:
1998 / SBIR / Phase II
Award Amount:
$390,000.00
Agency / Branch:
DOD / MDA
Principal Investigator:
David Hoylman
Abstract:
Thermal control of a space satellite in orbit is usually accomplished by balancing the energy emitted by the satellite as infrared radiation against the energy dissipated by internal electrical (and other) sources plus energy absorbed from the environment. Due to changing conditions as the satellite… More

SBIR Phase I: Infrared Spectroscopic Ellipsometry

Award Year / Program / Phase:
1998 / SBIR / Phase I
Award Amount:
$99,999.00
Agency:
NSF
Principal Investigator:
Ping He
Abstract:
N/a

N/A

Award Year / Program / Phase:
1999 / SBIR / Phase II
Award Amount:
$400,000.00
Agency:
NSF
Principal Investigator:
Ping He
Abstract:
N/a

Terahertz Ellipsometry for Reflection-Mode Material Characterization

Award Year / Program / Phase:
2008 / STTR / Phase I
Award Amount:
$99,993.00
Agency / Branch:
DOD / ARMY
Principal Investigator:
Craig M. Herzinger, Research Scientist
Research Institution:
UNIV. OF NEBRASKA-LINCOLN
RI Contact:
Suzan G. Lund
Abstract:
As technologies utilizing THz radiation (light) are developed, the optical properties for many materials need to be determined accurately as a function of frequency. In a security screening system, measured optical properties might be used to distinguish, independent of shape, between threat and… More

Terahertz Ellipsometry for Reflection-Mode Material Characterization

Award Year / Program / Phase:
2009 / STTR / Phase II
Award Amount:
$749,183.00
Agency / Branch:
DOD / ARMY
Principal Investigator:
Craig M. Herzinger, Research Scientist
Research Institution:
University of Nebraska-Lincoln
RI Contact:
Suzan G. Lund
Abstract:
As technologies utilizing THz radiation (light) develop, the optical properties for many materials need to be determined accurately as a function of frequency in a variety of applications including: THz threat detection and security screening applications