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Terahertz Ellipsometry for Reflection-Mode Material Characterization

Award Information

Agency:
Department of Defense
Branch:
Army
Award ID:
85037
Program Year/Program:
2008 / STTR
Agency Tracking Number:
A08A-013-0042
Solicitation Year:
N/A
Solicitation Topic Code:
N/A
Solicitation Number:
N/A
Small Business Information
J. A. Woollam Co., Inc.
645 M Street, Suite 102 Lincoln, NE 68508
View profile »
Woman-Owned: No
Minority-Owned: No
HUBZone-Owned: No
 
Phase 1
Fiscal Year: 2008
Title: Terahertz Ellipsometry for Reflection-Mode Material Characterization
Agency / Branch: DOD / ARMY
Contract: W911NF-08-C-0111
Award Amount: $99,993.00
 

Abstract:

As technologies utilizing THz radiation (light) are developed, the optical properties for many materials need to be determined accurately as a function of frequency. In a security screening system, measured optical properties might be used to distinguish, independent of shape, between threat and background materials. Improved optical elements for increasingly advanced THz systems will require optical constants and instrumentation for design and quality control. Measured THz optical properties are intrinsically connected to underlying low-energy physical processes and thereby allow testing of existing scientific theories and exploration of novel developments such as artificially structured meta-materials. Ellipsometry is the preeminent technique for accurate, quantitative determination of complex-valued optical constants and for non-destructively characterizing layered structures. The J. A. Woollam Co. proposes developing a variable-angle spectroscopic ellipsometer for operation at terahertz (THz) frequencies as an addition to the company's existing line of ellipsometers, which span frequencies from the infrared (IR-VASEr, 10 to 150 THz) to the vacuum ultraviolet (VASEr 150 to 2000 THz). Work by Drs. Mathias Schubert and Tino Hofmann at the University of Nebraska-Lincoln (UNL) in far-infrared and THz ellipsometry using frequency-domain techniques shows promise. In collaboration with UNL, phase I would evaluate potential system components (sources, detector, polarization-state control optics) for use in a commercial THz ellipsometer.

Principal Investigator:

Craig M. Herzinger
Research Scientist
4024777501
cherzinger@jawoollam.com

Business Contact:

Marge Knight
Controller
4024777501
mknight@jawoollam.com
Small Business Information at Submission:

J. A. WOOLLAM CO., INC.
645 M Street, Suite 102 Lincoln, NE 68508

EIN/Tax ID: 470762914
DUNS: N/A
Number of Employees:
Woman-Owned: No
Minority-Owned: No
HUBZone-Owned: No
Research Institution Information:
UNIV. OF NEBRASKA-LINCOLN
312 N. 14th St
Alexander West
Lincoln, NE 68588
Contact: Suzan G. Lund
Contact Phone: (402) 472-1930
RI Type: Nonprofit college or university