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ELECTRO-OPTIC PROBES FOR ON-WAFER TESTING OF GAAS MMICS

Award Information

Agency:
Department of Defense
Branch:
Air Force
Award ID:
6069
Program Year/Program:
1987 / SBIR
Agency Tracking Number:
6069
Solicitation Year:
N/A
Solicitation Topic Code:
N/A
Solicitation Number:
N/A
Small Business Information
LIGHTWAVE ELECTRONICS CORPORATION
LIGHTWAVE ELECTRONICS CORP. 2400 CHARLESTON RD MOUNTAIN VIEW, CA 94043
View profile »
Woman-Owned: No
Minority-Owned: No
HUBZone-Owned: No
 
Phase 1
Fiscal Year: 1987
Title: ELECTRO-OPTIC PROBES FOR ON-WAFER TESTING OF GAAS MMICS
Agency / Branch: DOD / USAF
Contract: N/A
Award Amount: $49,974.00
 

Abstract:

IN THE PROPOSED RESEARCH, LIGHTWAVE ELECTRONICS WILL INVESTIGATE MAKING SEPARATE OFF-SUBSTRATE MICROPROBES FOR GALLIUM ARSENIDE (GAAS) MONOLITHIC MICROWAVE INTEGRATED CIRCUITS (MMICS) BASED UPON THE ELECTRO-OPTIC SAMPLING TECHNIQUE. THESE PROBES WILL BE OF A SUFFICIENTLY SMALL SIZE SO THAT WHEN THEY ARE PLACED NEXT TO OR IN CONTACT WITH THE CIRCUIT OR DEVICE TO BE TESTED THEY WOULD NOT LOAD OR PERTURB IT. THIS TECHNIQUE MEASURES BOTH THE MAGNITUDE AND PHASE OF VOLTAGE WAVEFORMS AT PRECISE POINTS WITHIN THE MMICS, BUT IT DOES NOT REQUIRE POLISHED SURFACES OR A CLEAR OPTICAL PATH INTO THE DEVICE SUBSTRATE AT THE MEASUREMENT POINT AS IS THE CASE WHEN PROBING DIRECTLY IN THE SEMICONDUCTOR SUBSTRATE.

Principal Investigator:

Dr richard w wallace
4159620755

Business Contact:

Small Business Information at Submission:

Lightwave Electronics Corp
897-5a Independence Ave Mountain View, CA 94043

EIN/Tax ID:
DUNS: N/A
Number of Employees:
Woman-Owned: No
Minority-Owned: No
HUBZone-Owned: No