Fiscal Year:
1993
Title:
Automated Defect Analysis of Material Surface Defects
Agency / Branch:
DOD / USAF
Contract:
N/A
Award Amount:
$72,428.00
Abstract:
Analysis of material surface defect plays an important role in the development of new materials and fabrication processes, and in the diagnosis of process problems in material manufacture. The task of manual defect analysis is labor intensive and tedious, and the level of automation available is limited. We propose to develop image processing techniques and a complete system to fully automate defect analysis. Features that quantify size, shape, orientation, and distribution of defects will be selected according to user needs. Algorithms for efficient computation of these defect features will be developed. Capability for graphic data display will be incorporated.
Principal Investigator:
Dr. Frederick Wu
2038743100
Business Contact:
Small Business Information at Submission:
Materials Technologies Corp
57 Maryanne Drive Monroe, CT 06468
EIN/Tax ID:
061200419
DUNS:
N/A
Number of Employees:
Woman-Owned:
No
Minority-Owned:
No
HUBZone-Owned:
No