Dualband Polarization Sensitive Quantum Dot Detectors
Agency / Branch:
DOD / USAF
The proposed innovation will prove the feasibility of developing a spectral tunable and polarization sensitive quantum dot (QD) based detector in the 2-14 micron range. The aim is to satisfy the U.S. Air Force (USAF) requirements for passive spectral and polarization sensing in the infrared range without external filtering components and polarizers. The approach for achieving this challenge is to use a spectrally tunable QD detector structure integrated with a surface plasmon/grid polarizer based light coupling layer. The basic detector structure will consist of QD layer (InAs/GaAs), and double barrier layer (undoped GaAs) for tunneling, and a layer(undoped GaAs) with a metal grid for polarization. The proposed detector will allow the development of new polarization sensitive systems which will not require external polarizers or wavelength selection. This will reduce the weight requirements in sensor systems making them more widely applicable. By using adjcent pixels with perpendicular gratings the polarization components can be measured.
Small Business Information at Submission:
S. G. Matsik
Research Institution Information:
NDP OPTRONICS LLC.
236 Saint Martins Dr SE Mableton, GA 30126
Number of Employees:
GEORGIA STATE UNIV.
Atlanta, GA 30303
Nonprofit college or university