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SURFACE FIGURE MEASUREMENTS OF X-RAY OPTICS

Award Information

Agency:
Department of Energy
Branch:
N/A
Award ID:
3440
Program Year/Program:
1987 / SBIR
Agency Tracking Number:
3440
Solicitation Year:
N/A
Solicitation Topic Code:
N/A
Solicitation Number:
N/A
Small Business Information
Optel Systems/optel
317 Main Street East Rochester, NY 14445
View profile »
Woman-Owned: No
Minority-Owned: No
HUBZone-Owned: No
 
Phase 2
Fiscal Year: 1987
Title: SURFACE FIGURE MEASUREMENTS OF X-RAY OPTICS
Agency: DOE
Contract: N/A
Award Amount: $315,000.00
 

Abstract:

THIS PROPOSAL PRESENTS A RESEARCH PLAN FOR THE MEASUREMENT OF SURFACE FIGURE OF X-RAY OPTICAL COMPONENTS ON AN IN-PROCESS BASIS. THIS MEASUREMENT IS USEFUL DURING THE FABRICATION OF X-RAY OPTICAL COMPONENTS, ESPECIALLY SINCE THE PROPOSED MEASUREMENT IS NON-CONTACTING AND CAN MEASURE ALOW REFLECTANCE, OR UNCOATED SURFACE. THE LACK OF PRECISE SURFACE FIGURE CAN EFFECT THE PERFONNANCE OF X-RAY OPTICAL COMPONENTS. ALSO THE TIME IN REMOVING THE OPTIC AND THEN PERFORMING THE TEST CAN ADD SUBSTANTIALLY TO THE FABRICATIONEFFORT. THE PROPOSED RESEARCH PROGRAM IN PHASE I IS TO DEVELOP A TECHNIQUE FOR THE MEASUREMENT OF SURFACE FIGURE ONX-RAY OPTICAL COMPONENTS USING NON-CONTACT OPTICAL SCANNING INTERFEROMETRY IN THE POLISHING CYCLE. THE EFFECTS OF THE SIGNAL TO NOISE RATIO, FOCUSING ERRORS AND FIBRATION EFFECTSWILL BE STUDIED FOR A STATIONARY OPTIC LOCATED ON A POLISHING MACHINE. THE ANTICIPATED RESULT OF THE PHASE I RESEARCH WILL BE THE CHARACTERIZATION OF AN OPTICAL COMPONENT UNDER CONDITIONS SIMILAR TO THE OPTICAL SHOP. THEIMPLICATION OF THIS RESEARCH IS THE POTENTIAL FOR A RAPID NON-CONTACTING MEASUREMENT TECHNIQUE OF SURFACE FIGURE OF A FINISHED X-RAY MIRROR OR UNCOATED X-RAY MIRROR SUBSTRATE. THE POTENTIAL APPLICATION OF THIS RESEARCH IS THE DEVELOPMENT OF NEW MEASUREMENT TECHNIQUES AND TEST EQUIPMENTFOR THE X-RAY OPTICAL FABRICOTION INDUSTRY. THESE NEW MEASUREMENT TECHNIQUES AND TEST EQUIPMENT WILL HAVE THE POTENTIAL TO IMPROVE THE QUALITY OF X-RAY OPTICAL COMPONENTS.

Principal Investigator:

Dr. Thomas C. Bristow
Principal Investigator
7163856760

Business Contact:

Small Business Information at Submission:

Optel Systems/optel
317 Main Street East Rochester, NY 14445

EIN/Tax ID:
DUNS: N/A
Number of Employees: N/A
Woman-Owned: No
Minority-Owned: No
HUBZone-Owned: No