High Speed Non Ionizing Terahertz Measurement System to Replace Nuclear Gages
We propose to prove the feasibility of a high speed non ionizing time domain terahertz (THz) measurement system to replace nuclear gauges. Nuclear source gauges (such as beta and gamma) are used in industrial process monitoring and control, often to measure thickness or mass in paper, plastics, rubber, and food stuffs in manufacturing and packaging. A single system based on low power non-ionizing pulsed THz measurements will be developed which can replace multiple types of nuclear source gauges. The THz measurement system will have similar or superior capabilities, with micron thickness resolution, less than 1 mm lateral resolution, and measurement times as fast as 250 microseconds. A single THz system can be configured for through or single sided measurements. Both very thin (50mm) materials can be measured with at equivalent precision. In addition, one THz gauges will make simultaneous measurements of properties such as water and chemical content. The miniature THz transmitters and receivers are hardened and can be remotely mounted from their control system. They require no shielding. In phase I we will determine laboratory feasibility of the measurements; describe the functional specifications, capabilities, environmental considerations, and comparative lifecycle costs of a proposed prototype system.
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2925 Boardwalk Ann Arbor, MI 48104
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