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Liquid Metal Cluster Ion Source For Repair Of Packaging

Award Information

Agency:
Department of Defense
Branch:
Missile Defense Agency
Award ID:
19691
Program Year/Program:
1993 / SBIR
Agency Tracking Number:
19691
Solicitation Year:
N/A
Solicitation Topic Code:
N/A
Solicitation Number:
N/A
Small Business Information
SI Diamond Technology Inc
2435 North Blvd Houston, TX 77098
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Woman-Owned: No
Minority-Owned: No
HUBZone-Owned: No
 
Phase 1
Fiscal Year: 1993
Title: Liquid Metal Cluster Ion Source For Repair Of Packaging
Agency / Branch: DOD / MDA
Contract: N/A
Award Amount: $51,045.00
 

Abstract:

WE PROPOSE THE DEVELOPMENT OF A DIRECT METAL ETCH AND WRITE (DMEW) TECHNOLOGY BASED ON RECENTLY DEVELOPED LIQUID METAL CLUSTER ION SOURCES (LMCIS) FOR REPAIR OF CONDUCTING PATHS IN POLYCERAMIC SYSTEM. THE LMCIS'S ADVANTAGES OVER COMPETING DIRECT WRITE TECHNOLOGIES INCLUDE HIGH DEPOSITION RATE, NO PRE- OR POST-PROCESSING, GOOD ADHESION AND ALMOST BULK METALLIZATION RESISTIVITY. THIS HIGH THROUGHPUT AND LOCALLIZED DEPOSITION CAPABILITY WILL ENABLE TJIS TECHNOLOGY TO BE USEFUL IN OPTICAL TEST AND REPAIR OF MULTI-LAYER DENSITY INTERCONNECT SUBSTRATES POPULATED MCMs, BARE DIE BUMPING, AND PERSONALIZATION OF SEMI-CUSTOM MCMs. THE OBJECTIVE OF THIS PROJECT DURING PHASE I ARE TO DEMONSTRATE THE FEASIBILITY OF THIS PATENTED AND PROPRIETARY DIRECT WRITE TECHNOLOGY FOR REPAIR OF CONDUCTING PATHS IN POLYCERAMIC SYSTEM. DURING PHASE II, WE WILL DEVELOP A PRODUCTION WORTH DMEW TOOL AND RRELATED PROCESS TECHNOLOGIES FOR METALLIZATION REPAIR.

Principal Investigator:

Howard K. Schmidt, Phd
7135299040

Business Contact:

Small Business Information at Submission:

Si Diamond Technology, Inc.
2435 North Blvd Houston, TX 77098

EIN/Tax ID:
DUNS: N/A
Number of Employees:
Woman-Owned: No
Minority-Owned: No
HUBZone-Owned: No