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Company Information:

Company Name: Sandia Systems, Inc.
City: Albuquerque
State: NM
Zip+4: 87107
Woman-Owned: No
Minority-Owned: No
HUBZone-Owned: No
Website URL: N/A
Phone: N/A

Award Totals:

Program/Phase Award Amount ($) Number of Awards
SBIR Phase I $527,693.00 9
SBIR Phase II $709,792.00 2

Award List:

OPTICAL CHARACTERIZATION TECHNIQUES FOR SOI MATERIAL

Award Year / Program / Phase: 1987 / SBIR / Phase I
Agency: NSF
Principal Investigator:
Award Amount: $40,000.00

OPTICAL CHARACTERIZATION TECHNIQUES FOR SOI MATERIAL

Award Year / Program / Phase: 1989 / SBIR / Phase II
Agency: NSF
Principal Investigator:
Award Amount: $210,555.00
Abstract:
Present techniques of examing recrystallized silicon, including soi material, include a wet (acid) etch and examination with an optical microscope, x-ray diffraction, sem or tem microscopes. these techniques are slow, and usually the sample is destroyed. sandia systems proposes investigating… More

ION BEAM PROCESSING ZNSE

Award Year / Program / Phase: 1990 / SBIR / Phase I
Agency / Branch: DOD / USAF
Principal Investigator: Scott R Wilson
Award Amount: $58,533.00
Abstract:
Ion beams will be applied in several aspects of processing znse optical components. first the material will be milled, and then it will be coated using ion assisted deposition techniques. reduced scatter from the substrate and improve optical and mechanical properties of the film are anticipated.

AUTOMATED, DETERMINISTIC ASPHERE FABRICATION

Award Year / Program / Phase: 1991 / SBIR / Phase I
Agency: NASA
Principal Investigator:
Award Amount: $49,976.00

AUTOMATED, DETERMINISTIC ASPHERE FABRICATION

Award Year / Program / Phase: 1992 / SBIR / Phase II
Agency: NASA
Principal Investigator:
Award Amount: $499,237.00
Abstract:
In this project, ion-beam-figuring techniques will be applied to figure aspheric optical elements. a lens will be corrected for 5th-order aberrations as a demonstration. simulated ion-beam figuring of more complex elements will be performed to illustrate the power of the technique. in this project,… More

AUTOMATED, RAPID FABRICATION OF COMPLEX OPTICAL COMPONENTS

Award Year / Program / Phase: 1992 / SBIR / Phase I
Agency: NSF
Principal Investigator: Dr. Scott R. Wilson
Award Amount: $49,932.00
Abstract:
Ion beam figuring techniques will be applied to figure asphere optical elements. a mirror will be aspherized to remove the r(0)6 zernike contribution to correct for third-order and fifth-order spherical abberration and defocus. in addition, a phase correction plate with the same optical correction… More

OVERLAY AND GRATING LINESHAPE METROLOGY USING OPTICAL SCATTEROMETRY

Award Year / Program / Phase: 1992 / SBIR / Phase I
Agency / Branch: DOD / DARPA
Principal Investigator: Richard Krukar
Award Amount: $58,955.00
Abstract:
In microelectronics processing diffraction grating test patterns are created on the wafer for characterizing a process step. in this application the shape of the line is measured since it is determined by processing conditions. complete characterization of grating lineshape is tedious and often… More

Rapid Fabrication of Precise SiC Mirror Substrates

Award Year / Program / Phase: 1992 / SBIR / Phase I
Agency / Branch: DOD / MDA
Principal Investigator: Scott Wilson, Phd
Award Amount: $55,861.00
Abstract:
Sandia Systems, Inc. will apply novel processing techniques to demonstrate an improved fabrication process for SiC optical elements. We will combine the CVD of SiC replication process and ion beam figuring process to demonstrate fabrication of high quality optical elements. The CVD SiC would have no… More

Automated Defect Analysis Using a Doma Scatterometer and Image Analysis

Award Year / Program / Phase: 1993 / SBIR / Phase I
Agency / Branch: DOD / USAF
Principal Investigator: Richard Krukar
Award Amount: $63,881.00
Abstract:
We will model the optical scatter produced by different shapes and concentrations of defects using scalar diffraction theory. We will develop image processing techniques which can be used to supply features to analysis routines using the model data and determine the ability of the technique to… More

Thin-Shell Replication of Grazing Incidence Silicon-Carbide Mirrors

Award Year / Program / Phase: 1993 / SBIR / Phase I
Agency: NASA
Principal Investigator: Scott R. Wilson
Award Amount: $49,609.00

Post Exposure Bake Monitoring of Chemically Amplified Resists Using Scatterometry

Award Year / Program / Phase: 1994 / SBIR / Phase I
Agency / Branch: DOD / DARPA
Principal Investigator: Scott Wilson
Award Amount: $100,946.00
Abstract:
We will demonstrate the capability of scatterometry to provide a process monitor to post exposure bake of chemically amplified photoresist. Two or more scatterometers will be designed that are capable of monitoring the intensities of multiple diffraction orders that result from illuminating device… More