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IN SITU CHARACTERIZATION OF DIAMOND SURFACES DURING LOW PRESSURE CHEMICAL VAPOR…

Award Information

Agency:
Department of Defense
Branch:
Missile Defense Agency
Award ID:
10125
Program Year/Program:
1990 / SBIR
Agency Tracking Number:
10125
Solicitation Year:
N/A
Solicitation Topic Code:
N/A
Solicitation Number:
N/A
Small Business Information
Schmidt Instruments Inc.
2476 Bolsover Suite 234 Houston, TX 77005
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Woman-Owned: No
Minority-Owned: No
HUBZone-Owned: No
 
Phase 2
Fiscal Year: 1990
Title: IN SITU CHARACTERIZATION OF DIAMOND SURFACES DURING LOW PRESSURE CHEMICAL VAPOR DEPOSITION
Agency / Branch: DOD / MDA
Contract: N/A
Award Amount: $500,000.00
 

Abstract:

THE CHEMICAL MECHANISMS OF CHEMICAL VAPOR DEPOSITION (CVD) OF DIAMOND AND OTHER ELECTRONIC MATERIALS ARE AT BEST POORLYUNDERSTOOD. DURING PHASE I, WE SHALL CONSTRUCT A LOW PRESSURE CHEMICAL VAPOR DEPOSITION (LPCVD) REACTOR EQUIPPED WITH AN ION BEAM SURFACE PROBE AND DEMONSTRATE ITS UTILITY IN DETERMINING SURFACE STOICHIOMETRIES UNDER ACTUAL DEPOSITION CONDITIONS IN-SITU. THE GOAL IS TO PERFECT AND USE SUCH EQUIPMENT TO INVESTIGATE THE MECHANISM AND KINETICSOF HOMO-EPITAXIAL DIAMOND GROWTH. INSIGHTS INTO THE DEPOSITION CHEMISTRY OF DIAMOND OBTAINED BY THIS METHOD WILLENABLE THE DEVELOPMENT OF IMPROVED TECHNIQUES FOR MANUFACTURING SINGLE CRYSTAL DIAMOND FILM. NEW ELECTRONIC APPLICATIONS OF DIAMOND MAY BECOME PRACTICAL AND COMMERCIALIZABLE AS A RESULT OF THIS EFFORT.

Principal Investigator:

Dr Howard K Schmidt
7135299040

Business Contact:

Small Business Information at Submission:

Schmidt Instruments
2474 Bolsover - Ste 234 Houston, TX 77005

EIN/Tax ID:
DUNS: N/A
Number of Employees:
Woman-Owned: No
Minority-Owned: No
HUBZone-Owned: No