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Trap Engineering Technology for High-Reliability AlInGaN-based HFETs

Award Information

Agency:
Department of Defense
Branch:
Missile Defense Agency
Award ID:
64138
Program Year/Program:
2003 / SBIR
Agency Tracking Number:
031-1384
Solicitation Year:
N/A
Solicitation Topic Code:
N/A
Solicitation Number:
N/A
Small Business Information
Sensor Electronic Technology, Inc.
1195 Atlas Road Columbia, SC -
View profile »
Woman-Owned: No
Minority-Owned: No
HUBZone-Owned: No
 
Phase 1
Fiscal Year: 2003
Title: Trap Engineering Technology for High-Reliability AlInGaN-based HFETs
Agency / Branch: DOD / MDA
Contract: DASG6003P0265
Award Amount: $69,542.00
 

Abstract:

The goal of this program is to develop commercially viable epitaxial wafer technology for manufacturing of reliable high microwave power transistors and amplifiers for new generation of Transmit/Receive modules using trap engineering technology. The newgeneration of III-Nitride HFETs will be less prone to current collapse and stability degradation. Deep traps are responsible for the current collapse and affect long-term stability of GaN devices. However, the quantitative understanding of the role oftraps in III-nitrides is limited. The proposed combined approach of technology CAD (TCAD) simulations and transistor testing will enable us to develop GaN device technology virtually immune to trap induced degradation. Our approach will be used to developquaternary AlInGaN-based epitaxial wafer manufacturing technology for fabrication of reliable high RF power transistors, which is a key for the Transmit/Receive (T/R) module.

Principal Investigator:

Xuhong Hu
Research Scientist
8036479757
hu@s-et.com

Business Contact:

Remis Gaska
President and CEO
8036479757
gaska@s-et.com
Small Business Information at Submission:

SENSOR ELECTRONIC TECHNOLOGY, INC.
1195 Atlas Road Columbia, SC 29209

EIN/Tax ID: 141812556
DUNS: N/A
Number of Employees:
Woman-Owned: No
Minority-Owned: No
HUBZone-Owned: No