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FLAW INSPECTION IN NONFERROUS CONDUCTORS USING MAGNETO- OPTIC DETECTION METHODS

Award Information

Agency:
National Science Foundation
Branch:
N/A
Award ID:
1797
Program Year/Program:
1986 / SBIR
Agency Tracking Number:
1797
Solicitation Year:
N/A
Solicitation Topic Code:
N/A
Solicitation Number:
N/A
Small Business Information
Sigma Research Corp
234 Littleton Rd - Ste 2e Westford, MA 01886
View profile »
Woman-Owned: No
Minority-Owned: No
HUBZone-Owned: No
 
Phase 2
Fiscal Year: 1986
Title: FLAW INSPECTION IN NONFERROUS CONDUCTORS USING MAGNETO- OPTIC DETECTION METHODS
Agency: NSF
Contract: N/A
Award Amount: $193,000.00
 

Abstract:

A NEW METHOD FOR ACHIEVING VISUALIZATION OF FLAWS IN NONFERROUS CONDUCTORS SUCH AS ALUMINUM IS PROPOSED. LESS DIRECT VISUALIZATION TECHNIQUES, INCLUDING EDDY CURRENT AND DYE PENETRANT TECHNIQUES, ALREADY EXIT. HOWEVER, THESE METHODS ARE TIME CONSUMING AND REQUIRE CONSIDERABLE SUPPORT AND PREPARATION. THE NEW METHOD PROPOSES TO ACCOMPLISH DIRECT VISUALIZATION OF FLAWS IN NONFERROUS MATERIALS USING MAGNETIC GARNET FILMSDETECTORS OF MAGNETIC FIELDS ASSOCIATED WITH EDDY CURRENTS. BY ILLUMINATINF SUCH FILMS WITH PLANE POLARIZED LIGHT AND USING A POLARIZING ANALYZER, THE MAGNETIC DOMAIN SSTRUCTURE OF THE FILM CAN BE MADE DIRECTLY VISIBLE. THAT IS,THE COMPONENT OF THEMAGNETIC FLUX PERPENDICULAR TO THE FILMSURFACE PRODUCES EITHER A DARK AREA, A LIGHT GREEN AREA OR AN INTERMEDIATE "GRAY" VALUE. SINCE THE DOMAINS ARE ALTERED MAGNETIC FIELDS ASSOCIATED WITH EDDY CURRENTS PERTURBED BY FLAWS, A METHOD OF DIRECT VISUALIZATION OF FLAWS MAY BE ACHIEVED.

Principal Investigator:

G.l. Fitzpatrick
Senior Scientist
0

Business Contact:

G.l. fitzpatrick,
SENIOR SCIENTIST
Small Business Information at Submission:

Sigma Research, Inc.
565 Industry Drive Seattle, WA 98188

EIN/Tax ID:
DUNS: N/A
Number of Employees: N/A
Woman-Owned: No
Minority-Owned: No
HUBZone-Owned: No