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Company Information:

Company Name:
TestWorks
Address:
1511 Brimfield Drive
Sewickley, PA 15143-0000
Phone:
(412) 607-3216
URL:
N/A
EIN:
261140617
DUNS:
793711602
Number of Employees:
3
Woman-Owned?:
No
Minority-Owned?:
Yes
HUBZone-Owned?:
No

Commercialization:

Has been acquired/merged with?:
N/A
Has had Spin-off?:
N/A
Has Had IPO?:
N/A
Year of IPO:
N/A
Has Patents?:
N/A
Number of Patents:
N/A
Total Sales to Date $:
$ 0.00
Total Investment to Date $
$ 0.00
POC Title:
N/A
POC Name:
N/A
POC Phone:
N/A
POC Email:
N/A
Narrative:
N/A

Award Totals:

Program/Phase Award Amount ($) Number of Awards
SBIR Phase I $200,000.00 2
SBIR Phase II $500,000.00 1

Award List:

SBIR Phase I: IC Yield and Quality Improvement thru Test Data Analysis

Award Year / Program / Phase:
2008 / SBIR / Phase I
Award Amount:
$100,000.00
Agency:
NSF
Principal Investigator:
Abstract:
This Small Business Innovation Research Phase I research project is focused on improving the yield and quality of integrated circuits (ICs) thru information extraction from test measurement data. Yielding reliable, working integrated circuits (ICs) is becoming significantly more difficult as… More

SBIR Phase I:Design for Manufacturability Rule Evaluation using Test Measurement Data

Award Year / Program / Phase:
2010 / SBIR / Phase I
Award Amount:
$100,000.00
Agency:
NSF
Principal Investigator:
Abstract:
This Small Business Innovation Research (SBIR) Phase 1 project will use normally-available data produced by failing integrated circuits (ICs) to evaluate the capability of design-for-manufacturability (DFM) rules and guidelines to ensure reliable, working ICs. All ICs employ DFM rules and guidelines… More

SBIR Phase II: Integrated Circuit Yield and Quality Improvement thru Test Data Analysis

Award Year / Program / Phase:
2012 / SBIR / Phase II
Award Amount:
$500,000.00
Agency:
NSF
Principal Investigator:
Abstract:
This Small Business Innovation Research (SBIR) Phase II project develops an automated, software-based analysis methodology that enables yield and quality improvement of integrated circuits (ICs) through information extraction from test measurement data. Deriving actionable information from test data… More