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THE REPRODUCIBLE FORMATION OF HIGH RELIABILITY OHMIC CONTACT IN A NTYPE GAAS IS…

Award Information

Agency:
Department of Defense
Branch:
Air Force
Award ID:
1083
Program Year/Program:
1984 / SBIR
Agency Tracking Number:
1083
Solicitation Year:
N/A
Solicitation Topic Code:
N/A
Solicitation Number:
N/A
Small Business Information
UES, Inc.
4401 Dayton-Xenia Road Dayton, OH 45432-1894
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Woman-Owned: Yes
Minority-Owned: No
HUBZone-Owned: No
 
Phase 1
Fiscal Year: 1984
Title: THE REPRODUCIBLE FORMATION OF HIGH RELIABILITY OHMIC CONTACT IN A NTYPE GAAS IS A MAJOR PROBLEM IN THE GAAS BASED ELECTRONIC DEVICE TECHNOLOGY.
Agency / Branch: DOD / USAF
Contract: N/A
Award Amount: $63,061.00
 

Abstract:

THE REPRODUCIBLE FORMATION OF HIGH RELIABILITY OHMIC CONTACT IN A NTYPE GAAS IS A MAJOR PROBLEM IN THE GAAS BASED ELECTRONIC DEVICE TECHNOLOGY. STANDARD TECHNOLOGY UTILIZES FURNANCE ANNEALING OF AUGE EUTECTIC COMPOSITION WITH AN OVERLAYER OF NI AT TEMPERATURES IN THE RANGE OF 400-450 DEGREE C. THIS TECHNIQUE, ALTHOUGH IT WORKS, IS NOT VERY RELIABLE. BESIDES, THERE IS A NEED IN THE INDUSTRY TO DEVELOP A TECHNIQUE THAT WILL ALLOW THE FABRICATION OF OHMIC CONTACT AT LOW TEMPERATURE. ION BEAM MIXING IS AN ATTRACTIVE ALTERNATIVE TO THERMAL ALLLOYING. SO FAR, NO ONE HAS APPLIED THE ION BEAM MIXING TECHNIQUE TO FABRICATE OHMIC CONTACT TO N-TYPE GAAS. A PROPOSAL IS MADE HEREIN TO INVESTIGATE THE USE OF ION BEAM MIXING AS A TECHNIQUE FOR FORMING OHMIC CONTACT ON N-TYPE GAAS. THE BEST COMBINATION OF ION IMPLANTATION PARAMETERS SUCH AS ENERGY, MASS AND DOSE FOR OBTAINING MIXED LAYERS AT THE INTERFACE WILL BE DETERMINED. THE CONTACT RESISTIVITIES OF THE MIXED LAYERS WILL BE MEASURED BEFORE AND AFTER ANEALING AT LOW TEMPERATURES.

Principal Investigator:

Rabi bhattacharya
5134266900

Business Contact:

Small Business Information at Submission:

Universal Energy Systems Inc.
4401 Dayton-xenia Road Dayton, OH 45432

EIN/Tax ID:
DUNS: N/A
Number of Employees:
Woman-Owned: No
Minority-Owned: No
HUBZone-Owned: No