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TECHNIQUE TO CHARACTERIZE THE INTERFACES PRESENT IN SEMICONDUCTOR SUPERLATTICES

Award Information

Agency:
Department of Defense
Branch:
Air Force
Award ID:
2100
Program Year/Program:
1986 / SBIR
Agency Tracking Number:
2100
Solicitation Year:
N/A
Solicitation Topic Code:
N/A
Solicitation Number:
N/A
Small Business Information
UES, Inc.
4401 Dayton-Xenia Road Dayton, OH 45432-
View profile »
Woman-Owned: Yes
Minority-Owned: No
HUBZone-Owned: No
 
Phase 2
Fiscal Year: 1986
Title: TECHNIQUE TO CHARACTERIZE THE INTERFACES PRESENT IN SEMICONDUCTOR SUPERLATTICES
Agency / Branch: DOD / USAF
Contract: N/A
Award Amount: $102,000.00
 

Abstract:

THE ELECTRONIC AND OPTICAL PROPERTIES OF DEVICES BASED ON SEMICONDUCTOR SUPERLATTICES ARE FOUND TO BE SENSITIVE TO THE ATOMIC ARRANGEMENT AT OR NEAR THE INTERFACE OF THE COMPOSITIONAL MODULATION. THE EXAMINATION OF THE MATERIAL STATE OF THESE INTERFACES IS THEREFORE AN ESSENTIAL TASK. WE PROPOSE TO APPLY TRANSMISSION ELECTRON MICROSCOPY (TEM) TO THIS PROBLEM. WITH THIS TECHNIQUE, IT IS POSSIBLE TO STUDY THE NATURE OF THE DEFECTS PRESENT AT THE INTERFACE. IN ADDITION, THE ELECTRON MICROSCOPE CAN BE OPERATED UNDER A HIGH RESOLUTION SCALE WHEREBY PHASE CONTRAST MICROSCOPY CAN BE USED TO STUDY INTERFACE ON A MICROSCOPIC SCALE (APPROX 3A). AN ESSENTIAL PART OF ANY ELECTRON MICROSCOPIC STUDY IS THE PREPARATION OF THIN SPECIMENS. IN PHASE I ACTIVITIES WILL BE DIRECTED AT DEVELOPING TECHNIQUES FOR MAKING TWO DIFFERENT TYPES OF SPECIMEN, NAMELY (A) PLAN VIEW AND (B) CROSS(X)SECTIONAL VIEW SAMPLES. IN THE PLAN VIEW CASE IT IS POSSIBLE TO SEE THE CHARACTERISTICS OF THE TOP LAYER OF A DEVICE, WHEREAS WITH THE X-SECTIONAL TECHNIQUES IT WOULD BE POSSIBLE TO SEE THE INTERFACE DIRECTLY. ATTEMPTS WILL BE MADE IN PHASE I TO STUDY INTERFACES WITH HIGH RESOLUTION PHASE CONTRAST ELECTRON MICROSCOPY. THE MATERIAL CHARACTERISTICS OF INTERFACE CAN THEN BE RELATED TO THE ELECTRONIC AND OPTICAL PROPERTIES OF DEVICES.

Principal Investigator:

A K Rai
5134266900

Business Contact:

Small Business Information at Submission:

Universal Energy Systems Inc.
4401 Dayton-xenia Rd Dayton, OH 45432

EIN/Tax ID:
DUNS: N/A
Number of Employees:
Woman-Owned: No
Minority-Owned: No
HUBZone-Owned: No