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Woollam J A Co

Company Information
Address
315 S 9th St - Ste 22
Lincoln, NE 68508
United States
Information

UEI: N/A

# of Employees: 6
Ownership Information

HUBZone Owned: No

Socially and Economically Disadvantaged: No

Woman Owned: No

Award Charts




Award Listing

  • Record 1 TO 9

  1. IN-SITU MANUFACTURING CONTROL BY ELLIPSOMETRY

    Amount: $199,977.00

    N/A

    SBIRPhase II1992Department of Defense Defense Advanced Research Projects Agency

  2. NON-INVASIVE CONTROL OF II-VI SEMICONDUCTOR GROWTH

    Amount: $392,988.00

    N/A

    SBIRPhase II1992Department of Defense Defense Advanced Research Projects Agency

  3. DIAMONDLIKE CARBON HERMETIC ENCAPSULANTS

    Amount: $348,217.00

    DIAMONDLIKE CARBON (DLC) CAN BE DEPOSITED ON ROOM TEMPERATURE SUBSTRATES. FURTHERMORE, EXPERIMENTS ON SILICON SUBSTRATES HAVE SHOWN THAT MOISTURE DOES NOT PENETRATE DLC FILMS AS THIN AS 150 ANGSTROMS. ...

    SBIRPhase II1991Department of Defense Air Force

  4. IN-SITU MANUFACTURING CONTROL BY ELLIPSOMETRY

    Amount: $50,000.00

    N/A

    SBIRPhase I1990Department of Defense Defense Advanced Research Projects Agency

  5. NON-INVASIVE CONTROL OF II-VI SEMICONDUCTOR GROWTH

    Amount: $50,000.00

    N/A

    SBIRPhase I1990Department of Defense Defense Advanced Research Projects Agency

  6. DIAMONDLIKE CARBON HERMETIC ENCAPSULANTS

    Amount: $50,000.00

    N/A

    SBIRPhase I1990Department of Defense Air Force

  7. HIGH STRENGTH 110K CERAMIC SUPERCONDUCTORS

    Amount: $50,000.00

    TL-BA-CA-CU-O THIN FILMS HAVE ZERO RESISTANCE ABOVE 110K AND CRITICAL CURRENTS UP TO 10(6) A/CM(2) AT 77K. IN THICKER SAMPLES THE CRITICAL CURRENT IS LOWER. THUS, TO PREPARE STRONG, "BULK" SUPERCONDUC ...

    SBIRPhase I1989Department of Defense Defense Advanced Research Projects Agency

  8. MONOLAYER RESOLUTION CHARACTERIZATION BY VARIABLE ANGLE SPECTROSCOPIC ELLIPSOMETRY (VASE)

    Amount: $426,000.00

    ELLIPSOMETRY USES POLARIZED LIGHT REFLECTANCE TO CHARACTERIZE SURFACES, INTERFACES, AND THIN FILMS. ELLIPSOMETRY HAS TRADITIONALLY BEEN DONE USING A FEW (USUALLY ONE) DISCRETE ANGLES OF INCIDENCE OF T ...

    SBIRPhase II1988Department of Defense Defense Advanced Research Projects Agency

  9. MONOLAYER RESOLUTION CHARACTERIZATION BY VARIABLE ANGLE SPECTROSCOPIC ELLIPSOMETRY (VASE)

    Amount: $49,830.00

    N/A

    SBIRPhase I1987Department of Defense Defense Advanced Research Projects Agency
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