Ellipsometry uses polarized light reflectance to characterize surfaces, interfaces, and thin films. ellipsometry has traditionally been done using a few (usually one) discrete angles of incidence of the light beam with a surface normal, and a few selected wavelengths (frequently only 632.8 nm from a… More

Tl-ba-ca-cu-o thin films have zero resistance above 110k and critical currents up to 10(6) a/cm(2) at 77k. in thicker samples the critical current is lower. thus, to prepare strong, "bulk" superconductors we are proposing to make multilayer samples composed of strong substrates (either hastalloy or… More

Diamondlike carbon (dlc) can be deposited on room temperature substrates. furthermore, experiments on silicon substrates have shown that moisture does not penetrate dlc films as thin as 150 angstroms. the purpose of the proposed work is to determine if thin films of dlc can protect complete… More