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Company Information:

Company Name:
Woollam J A Co
Address:
315 S 9th St - Ste 22
Lincoln, NE 68508
Phone:
N/A
URL:
N/A
EIN:
N/A
DUNS:
N/A
Number of Employees:
6
Woman-Owned?:
No
Minority-Owned?:
No
HUBZone-Owned?:
No

Commercialization:

Has been acquired/merged with?:
N/A
Has had Spin-off?:
N/A
Has Had IPO?:
N/A
Year of IPO:
N/A
Has Patents?:
N/A
Number of Patents:
N/A
Total Sales to Date $:
$ 0.00
Total Investment to Date $
$ 0.00
POC Title:
N/A
POC Name:
N/A
POC Phone:
N/A
POC Email:
N/A
Narrative:
N/A

Award Totals:

Program/Phase Award Amount ($) Number of Awards
SBIR Phase I $249,830.00 5
SBIR Phase II $1,367,182.00 4

Award List:

MONOLAYER RESOLUTION CHARACTERIZATION BY VARIABLE ANGLE SPECTROSCOPIC ELLIPSOMETRY (VASE)

Award Year / Program / Phase:
1987 / SBIR / Phase I
Award Amount:
$49,830.00
Agency / Branch:
DOD / DARPA
Principal Investigator:
John A Woollam
Abstract:
N/a

MONOLAYER RESOLUTION CHARACTERIZATION BY VARIABLE ANGLE SPECTROSCOPIC ELLIPSOMETRY (VASE)

Award Year / Program / Phase:
1988 / SBIR / Phase II
Award Amount:
$426,000.00
Agency / Branch:
DOD / DARPA
Principal Investigator:
John A Woollam
Abstract:
Ellipsometry uses polarized light reflectance to characterize surfaces, interfaces, and thin films. ellipsometry has traditionally been done using a few (usually one) discrete angles of incidence of the light beam with a surface normal, and a few selected wavelengths (frequently only 632.8 nm from a… More

HIGH STRENGTH 110K CERAMIC SUPERCONDUCTORS

Award Year / Program / Phase:
1989 / SBIR / Phase I
Award Amount:
$50,000.00
Agency / Branch:
DOD / DARPA
Principal Investigator:
John A Woollam
Abstract:
Tl-ba-ca-cu-o thin films have zero resistance above 110k and critical currents up to 10(6) a/cm(2) at 77k. in thicker samples the critical current is lower. thus, to prepare strong, "bulk" superconductors we are proposing to make multilayer samples composed of strong substrates (either hastalloy or… More

IN-SITU MANUFACTURING CONTROL BY ELLIPSOMETRY

Award Year / Program / Phase:
1990 / SBIR / Phase I
Award Amount:
$50,000.00
Agency / Branch:
DOD / DARPA
Principal Investigator:
Dr John A Woollam
Abstract:
N/a

NON-INVASIVE CONTROL OF II-VI SEMICONDUCTOR GROWTH

Award Year / Program / Phase:
1990 / SBIR / Phase I
Award Amount:
$50,000.00
Agency / Branch:
DOD / DARPA
Principal Investigator:
Dr John A Woollam
Abstract:
N/a

DIAMONDLIKE CARBON HERMETIC ENCAPSULANTS

Award Year / Program / Phase:
1990 / SBIR / Phase I
Award Amount:
$50,000.00
Agency / Branch:
DOD / USAF
Principal Investigator:
Dr John A Woollam
Abstract:
N/a

DIAMONDLIKE CARBON HERMETIC ENCAPSULANTS

Award Year / Program / Phase:
1991 / SBIR / Phase II
Award Amount:
$348,217.00
Agency / Branch:
DOD / USAF
Principal Investigator:
Dr John A Woollam
Abstract:
Diamondlike carbon (dlc) can be deposited on room temperature substrates. furthermore, experiments on silicon substrates have shown that moisture does not penetrate dlc films as thin as 150 angstroms. the purpose of the proposed work is to determine if thin films of dlc can protect complete… More

IN-SITU MANUFACTURING CONTROL BY ELLIPSOMETRY

Award Year / Program / Phase:
1992 / SBIR / Phase II
Award Amount:
$199,977.00
Agency / Branch:
DOD / DARPA
Principal Investigator:
Dr John A Woollam
Abstract:
N/a

NON-INVASIVE CONTROL OF II-VI SEMICONDUCTOR GROWTH

Award Year / Program / Phase:
1992 / SBIR / Phase II
Award Amount:
$392,988.00
Agency / Branch:
DOD / DARPA
Principal Investigator:
Dr John A Woollam
Abstract:
N/a