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Company Information:

Company Name:
On-Line Technologies, Inc
Address:
87 Church St
East Hartford, CT 06108
Phone:
(806) 209-0719
URL:
N/A
EIN:
N/A
DUNS:
N/A
Number of Employees:
N/A
Woman-Owned?:
No
Minority-Owned?:
No
HUBZone-Owned?:
No

Commercialization:

Has been acquired/merged with?:
N/A
Has had Spin-off?:
N/A
Has Had IPO?:
N/A
Year of IPO:
N/A
Has Patents?:
N/A
Number of Patents:
N/A
Total Sales to Date $:
$ 0.00
Total Investment to Date $
$ 0.00
POC Title:
N/A
POC Name:
N/A
POC Phone:
N/A
POC Email:
N/A
Narrative:
N/A

Award Totals:

Program/Phase Award Amount ($) Number of Awards
SBIR Phase I $702,440.00 9
SBIR Phase II $1,495,504.00 3

Award List:

A Small, Light, Weight, Low Power, Low Cost, FT-IR Spectrometer

Award Year / Program / Phase:
1997 / SBIR / Phase I
Award Amount:
$59,861.00
Agency / Branch:
DOD / MDA
Principal Investigator:
Dr. Anthony S.bonanno
Abstract:
There are many military, commercial, and medical applications for a small, rugged, and inexpensive infrared (IR) spectrometer. A Fourier Transform Infrared (FT-IR) spectrometer would be an ideal tool for such measurements; however, FT-IR spectrometers are very sensitive to vibration and subject to… More

SBIR Phase I: Development of a Cell Controller for Epitaxial Silicon Fabrication

Award Year / Program / Phase:
1997 / SBIR / Phase I
Award Amount:
$74,939.00
Agency:
NSF
Principal Investigator:
Peter Rosenthal
Abstract:
N/a

A Small, Light, Weight, Low Power, Low Cost, FT-IR Spectrometer

Award Year / Program / Phase:
1998 / SBIR / Phase II
Award Amount:
$700,000.00
Agency / Branch:
DOD / MDA
Principal Investigator:
Dr. Anthony S.bonanno
Abstract:
There are many military, commercial, and medical applications for a small, rugged, and inexpensive infrared (IR) spectrometer. A Fourier Transform Infrared (FT-IR) spectrometer would be an ideal tool for such measurements; however, FT-IR spectrometers are very sensitive to vibration and subject to… More

Real-Time Whole Wafer Thermal Imaging for Semiconductor Process Monitoring

Award Year / Program / Phase:
1998 / SBIR / Phase I
Award Amount:
$99,898.00
Agency / Branch:
DOD / USAF
Principal Investigator:
Dr. Peter A. Rosenthal
Abstract:
This program will develop a whole wafer sensor for in situ monitoring and control of temperature during thermally assisted film processes such as rapid thermal processing (RTP), Metallorganic shemical vapor depostition (MOCVD), molecular beam epitaxy (MBE), pulsed laser deposition (PLD), and… More

Development of a Cell Controller for Epitaxial Silicon Fabrication

Award Year / Program / Phase:
1998 / SBIR / Phase II
Award Amount:
$395,521.00
Agency:
NSF
Principal Investigator:
Peter Rosenthal
Abstract:
N/a

Method & Instrumentation for Thick-Film SOI Non-Destructive Characterization

Award Year / Program / Phase:
1999 / SBIR / Phase I
Award Amount:
$98,225.00
Agency / Branch:
DOD / USAF
Principal Investigator:
Victor Yakovlev
Abstract:
N/a

In-Situ, Real-Time Process Control for Micro-Electro-Mechanical System (MEMS) Applications

Award Year / Program / Phase:
1999 / SBIR / Phase I
Award Amount:
$99,946.00
Agency:
NSF
Principal Investigator:
Sylvia Charpenay
Abstract:
N/a

In-Situ Characterization of Photresist Properties by Fourier Trnasform Infrared Based IR Spectroscopy

Award Year / Program / Phase:
1999 / SBIR / Phase I
Award Amount:
$99,699.00
Agency:
NSF
Principal Investigator:
Matthew Richter
Abstract:
N/a

N/A

Award Year / Program / Phase:
2000 / SBIR / Phase I
Award Amount:
$99,983.00
Agency:
NSF
Principal Investigator:
Jiazhan Xu
Abstract:
N/a

N/A

Award Year / Program / Phase:
2000 / SBIR / Phase I
Award Amount:
$0.00
Agency:
NSF
Principal Investigator:
Sylvie Charpenay
Abstract:
N/a

N/A

Award Year / Program / Phase:
2000 / SBIR / Phase II
Award Amount:
$399,983.00
Agency:
NSF
Principal Investigator:
Sylvie Charpenay
Abstract:
N/a

Exhaust Gas Monitoring for Process Control and Pollution Reduction in Semiconductor Manufacturing

Award Year / Program / Phase:
2001 / SBIR / Phase I
Award Amount:
$69,889.00
Agency:
EPA
Principal Investigator:
Abstract:
Perfluorocarbons (PFCs), known greenhouse gases, are used widely in semiconductor manufacturing. Several options for reducing the emissions of PFCs are being considered, including: (1) optimizing the process; (2) reducing the nonproduction operation of the fabrication tool; (3) recovering and… More