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Company Information:

Company Name:
Nanometrology International, Inc.
Address:
302 Woodbridge Ct.
Allen, TX 75013
Phone:
N/A
URL:
N/A
EIN:
264160715
DUNS:
832631589
Number of Employees:
4
Woman-Owned?:
No
Minority-Owned?:
No
HUBZone-Owned?:
No

Commercialization:

Has been acquired/merged with?:
N/A
Has had Spin-off?:
N/A
Has Had IPO?:
N/A
Year of IPO:
N/A
Has Patents?:
N/A
Number of Patents:
N/A
Total Sales to Date $:
$ 0.00
Total Investment to Date $
$ 0.00
POC Title:
N/A
POC Name:
N/A
POC Phone:
N/A
POC Email:
N/A
Narrative:
N/A

Award Totals:

Program/Phase Award Amount ($) Number of Awards
SBIR Phase I $90,000.00 1

Award List:

3D Tip Characterization and Surface Reconstruction

Award Year / Program / Phase:
2011 / SBIR / Phase I
Award Amount:
$90,000.00
Agency / Branch:
DOC / NIST
Principal Investigator:
Gregory A. Dahlen – (805) 569-8886
Abstract:
Nanometrology International, Inc. (NMI) proposes to demonstrate the feasibility of 3-dimensional (3D) characterization of nanoscale objects using scanning probe microscopy (SPM) with a measurement uncertainty of less than 0.7 nm. To accomplish this task, we propose a novel method of 3D tip… More