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Test Methodologies for Estimating Lifetime of Capacitive MEMS Switches
- Small Business Information
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Woman-Owned: NoMinority-Owned: NoHUBZone-Owned: No
- Phase 1
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Fiscal Year: 2011Title: Test Methodologies for Estimating Lifetime of Capacitive MEMS SwitchesAgency: DODContract: HQ0147-11-C-7563Award Amount: $99,921.00
Abstract:
This project will identify and demonstrate characterization, testing, and modeling methodologies that significantly improve accelerated testing of high-power RF MEMS switches and phase shifters. These innovations will lead to at least a 5X test time reduction over current real-time life test methodologies. These innovations will help spur the commercialization of RF MEMS switches and phase shifters, impacting a number of radar and communications systems for the US government.Small Business Information at Submission:MEMtronics Corporation
3000 Custer Road Suite 270-400 Plano, TX -EIN/Tax ID: 752953681DUNS: N/ANumber of Employees:Woman-Owned: NoMinority-Owned: NoHUBZone-Owned: No
Award Information
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Agency: Department of Defense |
Branch: N/A |
Award ID: |
Program Year/Program: 2011 / SBIR |
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Agency Tracking Number: B103-029-0188 |
Solicitation Year: 2010 |
Solicitation Topic Code: MDA10-029 |
Solicitation Number: 2010.3 |