Test Methodologies for Estimating Lifetime of Capacitive MEMS Switches
This project will identify and demonstrate characterization, testing, and modeling methodologies that significantly improve accelerated testing of high-power RF MEMS switches and phase shifters. These innovations will lead to at least a 5X test time reduction over current real-time life test methodologies. These innovations will help spur the commercialization of RF MEMS switches and phase shifters, impacting a number of radar and communications systems for the US government.
Small Business Information at Submission:
3000 Custer Road Suite 270-400 Plano, TX -
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