Fast Wafer-Scale Characterization Techniques for CZT

Award Information

Agency: Department of Defense	Branch: N/A	Award ID:	Program Year/Program: 2011 / SBIR
Agency Tracking Number: B103-031-0220	Solicitation Year: 2010	Solicitation Topic Code: MDA10-031	Solicitation Number: 2010.3

Small Business Information: CapeSym, Inc.
Suite 1B 6 Huron Drive Natick, MA -
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Woman-Owned: No

Minority-Owned: No

HUBZone-Owned: No

Phase 1: Fiscal Year: 2011

Title: Fast Wafer-Scale Characterization Techniques for CZT

Agency: DOD

Contract: HQ0147-11-C-7523

Award Amount: $99,974.00

Abstract:
The goal of this proposal is to develop fast wafer-scale techniques for characterization of Zn-concentration and precipitates and inclusions of Cd and Te. A novel approach to spectrometry will be used to develop a fully automated system for generation of high resolution 2D map of Zn-concentration that promises to be 10x-100x faster than current spectrometers. Advanced image processing techniques will be combined with infrared microscopy to generate 3D wafer-scale map of precipitates and inclusions, as well as decorated line defects in the CZT wafer. These capabilities promise to improve qualification of starting substrates as well as relating performance of MCT detectors with features of the substrate. These tools also promise to provide valuable insight into and help optimize bulk crystal growth processes.

Principal Investigator:
Shariar Motakef
President
(508) 653-7100
motakef@capesim.com

Business Contact:
Shariar Motakef
President
(508) 653-7100
motakef@capesim.com

Small Business Information at Submission:

CapeSym, Inc.
Suite 1B 6 Huron Drive Natick, MA -

EIN/Tax ID: 043183792

DUNS: N/A

Number of Employees:

Woman-Owned: No

Minority-Owned: No

HUBZone-Owned: No