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Defect Reduction Techniques for Large Format Infrared Detector Materials
- Small Business Information
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Woman-Owned: NoMinority-Owned: NoHUBZone-Owned: No
- Phase 1
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Fiscal Year: 2012Title: Defect Reduction Techniques for Large Format Infrared Detector MaterialsAgency / Branch: DOD / MDAContract: HQ0147-12-C-7675Award Amount: $99,916.00
Abstract:
Phase I objective is to demonstrate the feasiblility of our proposed approach to minimize the defect and dislocation size and densities in Si substrate based HgCdTe epitaxial layers with a cut off wavelength of ~10 microns at 77 K. Phase II effort will validate our approach with demonstration of large area Si substrate based HgCdTe epitaxial layers with area in excess of 25 cm2 and in addition demonstrate FPAs in large array formats with state of the art performance in these epitaxial layers.Small Business Information at Submission:Research Institution Information:IRDT Solutions, Inc
21832 Seacrest Lane Huntington Beach, CA -EIN/Tax ID: 270150618DUNS: N/ANumber of Employees:Woman-Owned: NoMinority-Owned: NoHUBZone-Owned: NoRensselaer Polytechnic Institute
110 Eigth Street
Troy, NY 12180-3590Contact: Richard E. ScammellContact Phone: (518) 276-6281
Award Information
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Agency: Department of Defense |
Branch: Missile Defense Agency |
Award ID: |
Program Year/Program: 2012 / STTR |
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Agency Tracking Number: B11A-002-0021 |
Solicitation Year: 2011 |
Solicitation Topic Code: MDA11-T002 |
Solicitation Number: 2011.A |