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Company Information:

Company Name:
TIPTEK, LLC
Address:
1122 WOODSTOCK LN
WEST CHESTER, PA 19382-7244
Phone:
N/A
URL:
N/A
EIN:
145244713
DUNS:
968357124
Number of Employees:
2
Woman-Owned?:
No
Minority-Owned?:
No
HUBZone-Owned?:
No

Award Totals:

Program/Phase Award Amount ($) Number of Awards
SBIR Phase I $300,000.00 2
SBIR Phase II $482,747.00 1

Award List:

SBIR Phase I: Batch Wafer-Scale Fabrication of Improved Probe Tips for Scanned Probe Microscopy

Award Year / Program / Phase:
2012 / SBIR / Phase I
Award Amount:
$150,000.00
Agency:
NSF
Principal Investigator:
Abstract:
This Small Business Innovation Research Phase I project will focus on the development and scale-up of a new process for fabricating probe tips for atomic force microscopy (AFM). In AFM, images of surfaces with atomic-scale resolution are created by rastering a probe across the surface. The probe… More

SBIR Phase II: Batch Wafer-Scale Fabrication of Improved Probe Tips for Scanned Probe Microscopy

Award Year / Program / Phase:
2013 / SBIR / Phase II
Award Amount:
$482,747.00
Agency:
NSF
Principal Investigator:
Abstract:
This Small Business Innovation Research (SBIR) Phase II project will perfect a proprietary batch-scale processing technique for fabricating ultrahard and ultrasharp atomic force microscopy (AFM) tips. The new process involves two steps. First, chemical vapor deposition (CVD) is used to coat the tips… More

Improved Probe Tips for Biomedical Atomic Force Microscopy via Batch Wafer-Scale

Award Year / Program / Phase:
2014 / SBIR / Phase I
Award Amount:
$150,000.00
Agency:
HHS
Principal Investigator:
Scott Lockledge – 215-853-2003
Abstract:
Project Summary/Abstract This SBIR grant funds efforts to perfect and scale up a newly patented process for fabricating ultrasharp and hard probe tips for making images of biological specimens. Scanning probe microscopy (SPM) methods such as atomic force microscopy (AFM) create images of surfaces by… More