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Low Dark Current, Extended Wavelength SWIR Sensors Using Hydrogenated nBn InGaAs

Award Information
Agency: Department of Defense
Branch: Special Operations Command
Contract: H92222-12-P-0063
Agency Tracking Number: S121-002-0079
Amount: $150,000.00
Phase: Phase I
Program: SBIR
Solicitation Topic Code: SOCOM12-002
Solicitation Number: 2012.1
Timeline
Solicitation Year: 2012
Award Year: 2012
Award Start Date (Proposal Award Date): 2012-06-15
Award End Date (Contract End Date): N/A
Small Business Information
123 Case Circle
Ardmore, OK -
United States
DUNS: 159048698
HUBZone Owned: No
Woman Owned: Yes
Socially and Economically Disadvantaged: Yes
Principal Investigator
 Ryan Cottier
 Research Scientist
 (580) 229-7109
 cottier@amethystresearch.com
Business Contact
 Terry Golding
Title: CEO
Phone: (580) 226-2751
Email: golding@amethystresearch.com
Research Institution
 Stub
Abstract

Improved performance SWIR sensors with extended wavelength response to 2.5 microns will be developed using two disruptive technologies with which Amethyst has demonstrated success: nBn detector structures and defect passivation via hydrogenation. Similar to conventional extended wavelength photodiodes, the improved sensors will based on mismatched InGaAs grown on graded buffer layers on InP substrates. Conventional photodiodes in mismatched InGaAs suffer performance degradation that is related to excess dark current related to defect processes. These photodiode structures will be replaced with nBn detector structures, which have been demonstrated to be very effective in suppression of defect processes in materials closely related to mismatched InGaAs. Additional suppression of defect-related dark current will be accomplished via defect-passivation of the mismatched InGaAs nBn materials. This work will build on recent studies by Amethyst, demonstrating hydrogenation-produced dark current suppression in mismatched InAs nBn devices. This recent success with hydrogenated mismatched nBn"s in InAs is directly relevant to the extended wavelength mismatched InGaAs nBn materials, which are 80% InAs. Order of magnitude dark current reduction is anticipated in extended wavelength sensors with high quantum efficiency operating between T=200K and room temperature.

* Information listed above is at the time of submission. *

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