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Advanced Compact X-Ray Spectrometer with High Resolution and Efficiency

Award Information

Department of Energy
Award ID:
Program Year/Program:
2013 / STTR
Agency Tracking Number:
Solicitation Year:
Solicitation Topic Code:
Solicitation Number:
Small Business Information
Incom Inc.
284 Southbridge Road Charlton, MA 01507-5238
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Woman-Owned: No
Minority-Owned: No
HUBZone-Owned: No
Phase 1
Fiscal Year: 2013
Title: Advanced Compact X-Ray Spectrometer with High Resolution and Efficiency
Agency: DOE
Contract: DE-FG02-13ER86546
Award Amount: $146,232.00


The combination of X-ray absorption spectroscopy (XAS) with x-ray emission spectroscopy (XES) provides unique diagnostic analysis of both the structure and chemical composition of complex heterogeneous materials. The penetration of X-rays make this method ideal for studying and optimizing material properties under realistic, real time reaction conditions with simultaneous analysis of reaction products (in-operando). The full potential of XAS and XES measurements are limited by the detectors of the spectrometers. We propose to investigate a new detector design that will result in a highly efficient, easy to handle, low-cost, high-resolution detection system with excellent background suppression. The detection system is based on a new pre-collimation x-ray optic with a 7-8 degree solid collection angle that produces a collimated output with a 50-200m spot size. The small size and emittance angle of the pre-collimation optic allow additional optics to further collimate the x- rays such that a plane crystal can function as a wavelength selective element. This approach dramatically increases the flexibility and ease-of-use of the instrument. Measurement costs are reduced because the same setup can be used for different wavelengths with greater collection efficiency by only changing the crystal angle. Under this development program we will demonstrate feasibility of fabricating the pre-collimation optic critical to the design of this detector system. This polycapillary based x-ray optic will then be used in a mock up detector to verify the feasibility of the design. This development program will benefit of x-ray detectors beyond those used in synchrotron radiation facilities. For example, it could replace the conventional energy dispersive detectors like silicon drift diodes in scanning electron microscopes (SEM).

Principal Investigator:

Daniel Bennis

Business Contact:

Steve Morrill
Small Business Information at Submission:

Incom Inc.
294 Sturbridge Road Charlton, MA 01507-5238

EIN/Tax ID: 042483274
Number of Employees:
Woman-Owned: No
Minority-Owned: No
HUBZone-Owned: No
Research Institution Information:
Brookhaven National Laboratory
Building 817
PO Box 5000
Upton, NY 11973-