An Automated Lapping Apparatus and Process for High-Precision Random Profile Roughness Specimen Fabrication
Agency / Branch:
DOC / NIST
The measurement and quality control for smooth engineering surfaces are becoming more and more important in modern science and technology due to their important engineering functions and high production costs. NIST has frequently received requests from U.S. industry to provide Standard Reference Material (SRM) high-precision, random profile roughness specimens to support smooth surface measurements. X-wave Innovations, Inc. (XII) proposes an automated lapping apparatus and process for fabricating the high-precision, random profile roughness specimens. The proposed apparatus and process possess advantages such as high manufacturing throughput, high reproducibility, and low operation cost. The success of this SBIR effort will result in an automated apparatus for manufacturing SRM high-precision, random profile roughness specimens for NIST to support U.S, manufacturing industry.
Small Business Information at Submission:
Principal Investigator:Dan Xiang
X-wave Innovations, Inc.
407 Upshire Circle Gaithersburg, MD 20878-
Number of Employees: