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Company Information:

Company Name: ADAM INSTRUMENT CO., INC.
City: Blue Ash
State: OH
Zip+4: 45242
Woman-Owned: No
Minority-Owned: No
HUBZone-Owned: No
Website URL: N/A
Phone: N/A

Award Totals:

Program/Phase Award Amount ($) Number of Awards
SBIR Phase I $170,000.00 2
SBIR Phase II $1,350,000.00 2

Award List:

Advanced Analytical Techniques for Determining Metal Speciation in Contaminated Soils

Award Year / Program / Phase: 1995 / SBIR / Phase I
Agency / Branch: DOD / ARMY
Principal Investigator: Douglas G. Frank
Award Amount: $70,000.00

Advanced Analytical Techniques for Determining Metal Speciation in Contaminated Soils

Award Year / Program / Phase: 1996 / SBIR / Phase II
Agency / Branch: DOD / ARMY
Principal Investigator: Douglas G. Frank
Award Amount: $600,000.00
Abstract:
The primary objective of the proposed project is to develop innovative new analytical instrumentation and methodology capable of non destructive detection and identification of trace amounts of metals in contaminated soils. Once developed, the instrumentation and methodology could be interfaced… More

Non-Destructive Real-Time In-Situ Analysis of Vacuum Grown and Processed Infrared Material and Sensor Arrays

Award Year / Program / Phase: 1997 / SBIR / Phase I
Agency / Branch: DOD / ARMY
Principal Investigator: Douglas G. Frank
Award Amount: $100,000.00
Abstract:
The objective of the proposed project is to develop innovative new analytical instrumentation and methodology capable of performing fully automated, non-destructive analysis of semiconductor sensor elements and arrays locate on three inch diameter wafers. The instrumentation would be capable of… More

Non-Destructive Real-Time In-Situ Analysis of Vacuum Grown and Processed Infrared Material and Senso

Award Year / Program / Phase: 1998 / SBIR / Phase II
Agency / Branch: DOD / ARMY
Principal Investigator: Douglas G. Frank
Award Amount: $750,000.00
Abstract:
The objective of the proposed project is to develop innovative new analytical instrumentation and methodology capable of performing fully automated, non-destructive analysis of semiconductor sensor elements and arrays locate on three inch diameter wafers. The instrumentation would be capable of… More