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PARAMETRIC RADIATION AS AN INTENSE MONOCHROMATIC X-RAY SOURCE

Award Information

Agency:
Department of Energy
Branch:
N/A
Award ID:
14512
Program Year/Program:
1992 / SBIR
Agency Tracking Number:
14512
Solicitation Year:
N/A
Solicitation Topic Code:
N/A
Solicitation Number:
N/A
Small Business Information
Adelphi Technology, Inc.
2003 E Bayshore Rd Redwood City, CA 94063-4121
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Woman-Owned: No
Minority-Owned: No
HUBZone-Owned: No
 
Phase 2
Fiscal Year: 1992
Title: PARAMETRIC RADIATION AS AN INTENSE MONOCHROMATIC X-RAY SOURCE
Agency: DOE
Contract: N/A
Award Amount: $495,321.00
 

Abstract:

PARAMETRIC-X-RADIATION (PXR) IS BEING INVESTIGATED IN PHASE I OF THIS PROJECT AS AN INTENSE, MONOCHROMATIC X-RAY SOURCE. THIS RADIATION IS HIGHLY COLLIMATED, HAS A BANDWIDTH OF 0.1% FULL WIDTH AT HALF MIXIMUM, AND AN INTENSITY EQUAL TO THAT OF SYNCHROTON RADIATION ON A PER ELECTRON BASIS. PXR IS PRODUCED BY A HIGH ENERGY (>1MEV) ELECTRON PASSING THROUGH A CRYSTALLINE STRUCTURE; AS THE ELECTRON PASSES THROUGH THE PLANES OF A CRYSTAL, IT EXCITES THE CRYSTALLINE ELECTRONS ALONG THE PLANES. IF THE PATH OF THE INCIDENT ELECTRON IS PROPERLY ALIGNED WITH RESPECT TO THE PLANES OF THE CRYSTAL, THE RADIATION GIVEN OFF BY THE EXCITATIONS AT THE SUCCESSIVE PLANES WILL ADD COHERENTLY, PRODUCING DIRECTIONAL MONOCHROMATIC RADIATION IN A PROCESS SIMILAR TO THE BRAGG DIFFRACTION OF X-RAYS. INDEED, THE ENERGY AND DIRECTION OF PXR IS GIVEN BY THE BRAGG RELATION FOR THE GIVEN GEOMETRY. BECAUSE PARAMETRIC RADIATION IS EMITTED AT AN ANGLE TO THE ELECTRON BEAM, IT IS EASILY SEPARATED FROM THE ELECTRON BEAM AND BREMSSTRAHLUNG. THIS FACT, ALONG WITH THE NARROW BANDWIDTH, COLLIMATION, AND INTENSITY OF PARAMETRIC RADIATION MAKE PXR A PROMISING X-RAYSOURCE FOR NONINVASIVE DIGITAL SUBTRACTION ANGIOGRAPHY AND OTHER APPLICATIONS THAT REQUIRE INTENSE, TUNABLE RADIATION PEAKS. THIS PROJECT INCLUDES (1) DETERMING THE MAXIMUM PARAMETRIC X-RAY INTENSITY THAT CAN BE ACHIEVED FROM A CRYSTAL BY ANALYZING THE EFFECT OF THE CRYSTAL COMPOSITION ON THE MAXIMUM SUSTAINABLE ELECTRON CURRENT AND THE RESULTING MAXIMUM X-RAY PRODUCTION, (2) STUDYING THE USE OF LAYERED SYNTHETIC MEDIA TO PRODUCE GREATER INTENSITY BY INCREASING THE BANDWIDTH OF THE RADIATION, AND (3) STUDYING THE USE OF MULTIPLE CRYSTALS TO INCREASE THE RADIATION INTENSITY. THE RESULTS OF THIS RESEARCH SHOULD ESTABLISH THE VIABILITY OF PXR AS AN INTENSE, COLLIMATED, MONOCHROMATIC X-RAY SOURCE.

Principal Investigator:

Dr Melvin A Piestrup
Principal Investigator
0

Business Contact:


4153287337
Small Business Information at Submission:

Adelphi Technology Inc.
285 Hamilton Ave Suite 430 Palo Alto, CA 94301

EIN/Tax ID:
DUNS: N/A
Number of Employees: N/A
Woman-Owned: No
Minority-Owned: No
HUBZone-Owned: No