Improved Silicon Drift Detector Coincidence Rejection for Digital Pulse Processors
Agency / Branch:
DOC / NIST
The recent emergence of the Silicon Drift detector (SDD), for use in Energy Dispersive x-ray Spectroscopy (EDS), has made possible x-ray event streams with input count rates in the range of 1-10 Mcps. Modern digital pulse processors are therefore required to run at fast time constants to achieve reasonable throughput; however, this causes significant coincidence artifacts to appear in the spectrum, thus complicating analysis. Phase I will design and demonstrate an improved coincidence rejection system based on 4pi's digital pulse processor development, and earlier pulse-shape analysis and recovery research.
Small Business Information at Submission:
4pi Analysis, Inc.
3500 Westgate Dr., Suite 403 Durham, NC 27707
Number of Employees: