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Improved Silicon Drift Detector Coincidence Rejection for Digital Pulse…

Award Information

Agency:
Department of Commerce
Branch:
National Institute of Standards and Technology
Award ID:
84027
Program Year/Program:
2008 / SBIR
Agency Tracking Number:
313-08
Solicitation Year:
N/A
Solicitation Topic Code:
N/A
Solicitation Number:
N/A
Small Business Information
4pi Analysis, Inc.
3500 Westgate Dr., Suite 403 Durham, NC 27707
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Woman-Owned: No
Minority-Owned: No
HUBZone-Owned: No
 
Phase 1
Fiscal Year: 2008
Title: Improved Silicon Drift Detector Coincidence Rejection for Digital Pulse Processors
Agency / Branch: DOC / NIST
Contract: SB1341-08-SE-0661
Award Amount: $90,000.00
 

Abstract:

The recent emergence of the Silicon Drift detector (SDD), for use in Energy Dispersive x-ray Spectroscopy (EDS), has made possible x-ray event streams with input count rates in the range of 1-10 Mcps. Modern digital pulse processors are therefore required to run at fast time constants to achieve reasonable throughput; however, this causes significant coincidence artifacts to appear in the spectrum, thus complicating analysis. Phase I will design and demonstrate an improved coincidence rejection system based on 4pi's digital pulse processor development, and earlier pulse-shape analysis and recovery research.

Principal Investigator:

Stefan Jeglinski
9194891757
jeglin@4pi.com

Business Contact:

Small Business Information at Submission:

4pi Analysis, Inc.
3500 Westgate Dr., Suite 403 Durham, NC 27707

EIN/Tax ID:
DUNS: N/A
Number of Employees: N/A
Woman-Owned: No
Minority-Owned: No
HUBZone-Owned: No