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Company Information:

Company Name:
Advanced Microscopy Techniques
Address:
50 Prospect St
Rowley, MA 01969
Phone:
N/A
URL:
N/A
EIN:
N/A
DUNS:
N/A
Number of Employees:
N/A
Woman-Owned?:
No
Minority-Owned?:
No
HUBZone-Owned?:
No

Commercialization:

Has been acquired/merged with?:
N/A
Has had Spin-off?:
N/A
Has Had IPO?:
N/A
Year of IPO:
N/A
Has Patents?:
N/A
Number of Patents:
N/A
Total Sales to Date $:
$ 0.00
Total Investment to Date $
$ 0.00
POC Title:
N/A
POC Name:
N/A
POC Phone:
N/A
POC Email:
N/A
Narrative:
N/A

Award Totals:

Program/Phase Award Amount ($) Number of Awards
SBIR Phase I $133,990.00 3
SBIR Phase II $130,384.00 1

Award List:

CRYSTALLOGRAPHY OF CERAMIC PARTICULATE IN METAL-MATRIX COMPOSITES

Award Year / Program / Phase:
1993 / SBIR / Phase I
Award Amount:
$34,976.00
Agency:
DOC
Principal Investigator:
James F Mancuso
Abstract:
Metal-particulate interfaces have a major impact on the properties of ceramic-reinforced metal-matrix composites. desired interface characteristics are adherence, mechanical toughness and resistance to environmental attack. in turn, these properties are dictated by surface morphology, chemical… More

ENERGY FILTERED DETECTOR FOR MICRO-DIFFRACTION IN THE SEM

Award Year / Program / Phase:
1993 / SBIR / Phase I
Award Amount:
$49,756.00
Agency:
NSF
Principal Investigator:
James F Mancuso
Abstract:
N/a

ENERGY FILTERED DETECTOR FOR MICRO-DIFFRACTION IN THE SEM

Award Year / Program / Phase:
1995 / SBIR / Phase II
Award Amount:
$130,384.00
Agency:
NSF
Principal Investigator:
James F Mancuso
Abstract:
Micro-diffraction-based crystallography is essential to materials design and process understanding in key industrial applications such as microelectronics, superconductivity, solar energy, structural composites, and metal forming. the scanning electron microscope (sem) can provide high spatial… More

3-D Materials Characterization Using Structured Illumination in the SEM

Award Year / Program / Phase:
1995 / SBIR / Phase I
Award Amount:
$49,258.00
Agency:
DOC
Principal Investigator:
James F. Mancuso, Ph.D. , President
Abstract:
Microscopic measurement of surface topography is a continuing need in microfabrication technology and materials research. The aim of this research is to adapt the scanning electron microscope (SEM) to the quantitative measurement of a wide range of surface structures. The SEM is a widely used… More