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3-D Materials Characterization Using Structured Illumination in the SEM

Award Information

Agency:
Department of Commerce
Branch:
N/A
Award ID:
30937
Program Year/Program:
1995 / SBIR
Agency Tracking Number:
30937
Solicitation Year:
N/A
Solicitation Topic Code:
N/A
Solicitation Number:
N/A
Small Business Information
Advanced Microscopy Techniques
50 Prospect St Rowley, MA 01969
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Woman-Owned: No
Minority-Owned: No
HUBZone-Owned: No
 
Phase 1
Fiscal Year: 1995
Title: 3-D Materials Characterization Using Structured Illumination in the SEM
Agency: DOC
Contract: 407
Award Amount: $49,258.00
 

Abstract:

Microscopic measurement of surface topography is a continuing need in microfabrication technology and materials research. The aim of this research is to adapt the scanning electron microscope (SEM) to the quantitative measurement of a wide range of surface structures. The SEM is a widely used measurement tool in materials science and semiconductor fabrication. The SEM's strength is that it provides high resolution images which often have a three dimensional appearance. Its weakness is that highly precise three dimensional measurements are difficult or impossible even with stereo techniques. In addition the accuracy of two dimensional measurement is degraded by the reliance of intensity profiles to determine the location of edges. The proposed research will examine the feasibility of using structured illumination to generate SEM images that provide purely topographical information while maintaining the conditions useful for normal viewing as well. In this technique the SEM projects a known pattern on the specimen. The beam either etches the surface or promotes a deposition process. The patterned surface is viewed in the SEM from a different angle of incidence. The detected pattern is a direct measure of the topography of the specimen surface. The accuracy of the measurement depends only on the quality of the generated pattern and the SEM image. As long as the pattern is detectable, accuracy is independent of composition and the multitude of contrast mechanisms in the SEM. In addition, the proposed device would be cost effective and provide easily interpretable data that would make it suitable for widespread use.

Principal Investigator:

James F. Mancuso, Ph.D.
President
0

Business Contact:

Small Business Information at Submission:

Advanced Microscopy Techniques
50 Prospect Street Box 661 Rowley, MA 01969

EIN/Tax ID:
DUNS: N/A
Number of Employees: N/A
Woman-Owned: No
Minority-Owned: No
HUBZone-Owned: No