X-Ray Diagnostics for High-Temperature Superconductor Processing
65165 The development of a practical manufacturing process for high temperature superconductors is slowed by the lack of suitable diagnostic tools that can relate a rapidly measured property during production to the electrical performance of the finished product. This project will develop x-ray diagnostics to provide a rapid means of measuring film composition and crystalline texture on-line. In Phase I, a diffraction method was successfully demonstrated for rapidly measuring a texture parameter of the superconducting film, which was correlated with its ability to conduct high currents. In addition, a study of x-ray fluorescence from sample films suggested two alternate approaches for achieving high-sensitivity measurements of elemental composition. In Phase II, prototype diffraction and fluorescence instruments will be tested at facilities that are involved in the development of commercial manufacturing processes for high temperature superconductors. Commercial Applications and Other Benefits as describe by the awardee: These diagnostics should provide the national laboratories with real-time monitors of superconducting film quality, permitting rapid feedback for optimizing process parameters. The x-ray diagnostics should also be useful in the commercial sector as a quality control tool during the manufacturing process.
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