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ON-WAFER TESTING OF MONOLITHIC MICROWAVE INTEGRATED CIRCUITS (MMICS)
- Small Business Information
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Woman-Owned: NoMinority-Owned: NoHUBZone-Owned: No
- Phase 1
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Fiscal Year: 1987Title: ON-WAFER TESTING OF MONOLITHIC MICROWAVE INTEGRATED CIRCUITS (MMICS)Agency / Branch: DOD / USAFContract: N/AAward Amount: $45,118.00
Abstract:
WAFER PROBING IS THE CRITICAL LINK BETWEEN WAFER FABRICATION, AND DEVICE PACKAGING OR HYBRID SUBSYSTEM INSERTION. FOR GAAS MMICS TO BE COST EFFECTIVE, THEY MUST BE TESTED IN A MANNER THAT IS RELIABLE, FAST, AND EFFICIENT. THIS PROPOSAL DESCRIBES A PROGRAM TO DEVELOP EQUIPMENT AND TECHNIQUES FOR HIGH RATE, HIGH VOLUME MMIC WAFER PROBING. PHASE I OF THIS PROGRAM WILL INCLUDE AN EXPERIMENT USING EXISTING EQUIPMENT AND MMICS, AND RESEARCH TO DEFINE THE PRESENT STATE-OF-THE-ART, TO IDENTIFY THOSE AREAS WHICH MUST BE APPROACHED. HARDWARE COMPATIBLE WITH ACCURATE, HIGH-SPEED MICROWAVE TESTING, AND TECHNIQUES FOR INTERFACING THIS EQUIPMENT TO MMICS ON-WAFER WILL BE INVESTIGATED. REDUCING THE COST OF THE FINAL MMIC DEVICE BY EFFECTIVE SORTING OF DIE IS THE PRIMARY OBJECTIVE OF THIS WORK.Small Business Information at Submission:Principal Investigator:
Phillip w wallace
2016685000Business Contact:
Anadigics Inc
35 Technology Dr Warren, NJ 07060EIN/Tax ID:DUNS: N/ANumber of Employees:Woman-Owned: NoMinority-Owned: NoHUBZone-Owned: No
Award Information
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Agency: Department of Defense |
Branch: Air Force |
Award ID: 5482 |
Program Year/Program: 1987 / SBIR |
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Agency Tracking Number: 5482 |
Solicitation Year: N/A |
Solicitation Topic Code: N/A |
Solicitation Number: N/A |