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ON-WAFER TESTING OF MONOLITHIC MICROWAVE INTEGRATED CIRCUITS (MMICS)

Award Information

Agency:
Department of Defense
Branch:
Air Force
Award ID:
5482
Program Year/Program:
1987 / SBIR
Agency Tracking Number:
5482
Solicitation Year:
N/A
Solicitation Topic Code:
N/A
Solicitation Number:
N/A
Small Business Information
Anadigics Inc
35 Technology Dr Warren, NJ 07060
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Woman-Owned: No
Minority-Owned: No
HUBZone-Owned: No
 
Phase 1
Fiscal Year: 1987
Title: ON-WAFER TESTING OF MONOLITHIC MICROWAVE INTEGRATED CIRCUITS (MMICS)
Agency / Branch: DOD / USAF
Contract: N/A
Award Amount: $45,118.00
 

Abstract:

WAFER PROBING IS THE CRITICAL LINK BETWEEN WAFER FABRICATION, AND DEVICE PACKAGING OR HYBRID SUBSYSTEM INSERTION. FOR GAAS MMICS TO BE COST EFFECTIVE, THEY MUST BE TESTED IN A MANNER THAT IS RELIABLE, FAST, AND EFFICIENT. THIS PROPOSAL DESCRIBES A PROGRAM TO DEVELOP EQUIPMENT AND TECHNIQUES FOR HIGH RATE, HIGH VOLUME MMIC WAFER PROBING. PHASE I OF THIS PROGRAM WILL INCLUDE AN EXPERIMENT USING EXISTING EQUIPMENT AND MMICS, AND RESEARCH TO DEFINE THE PRESENT STATE-OF-THE-ART, TO IDENTIFY THOSE AREAS WHICH MUST BE APPROACHED. HARDWARE COMPATIBLE WITH ACCURATE, HIGH-SPEED MICROWAVE TESTING, AND TECHNIQUES FOR INTERFACING THIS EQUIPMENT TO MMICS ON-WAFER WILL BE INVESTIGATED. REDUCING THE COST OF THE FINAL MMIC DEVICE BY EFFECTIVE SORTING OF DIE IS THE PRIMARY OBJECTIVE OF THIS WORK.

Principal Investigator:

Phillip w wallace
2016685000

Business Contact:

Small Business Information at Submission:

Anadigics Inc
35 Technology Dr Warren, NJ 07060

EIN/Tax ID:
DUNS: N/A
Number of Employees:
Woman-Owned: No
Minority-Owned: No
HUBZone-Owned: No