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Transmitted Wavefront Metrology of Multiple-Layer Dome Optics Using a Scanning…

Award Information

Agency:
Department of Defense
Branch:
Army
Award ID:
78565
Program Year/Program:
2006 / SBIR
Agency Tracking Number:
A052-151-0236
Solicitation Year:
N/A
Solicitation Topic Code:
N/A
Solicitation Number:
N/A
Small Business Information
ASE OPTICS
2489 Brighton Henrietta Town Line Rd. Rochester, NY 14623
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Woman-Owned: No
Minority-Owned: No
HUBZone-Owned: No
 
Phase 1
Fiscal Year: 2006
Title: Transmitted Wavefront Metrology of Multiple-Layer Dome Optics Using a Scanning Low-Coherence Dual Interferometer (SLCDI)
Agency / Branch: DOD / ARMY
Contract: W31P4Q-06-C-0203
Award Amount: $69,873.00
 

Abstract:

We propose a scanning low-coherence dual interferometery system that can accurately measure the optical thickness of hemispheric optical domes used as missile windows. The system has the unique capability to measure the optical thicknesses of individual layers within domes composed of multiple materials. The optical thickness map created during the scanning process is directly related to the wavefront transmission properties of the dome.

Principal Investigator:

Damon Diehl
Optical Engineer / Scientist
5854240335
damond@aseoptics.com

Business Contact:

Christopher Cotton
President
5853031574
chrisc@aseoptics.com
Small Business Information at Submission:

ASE OPTICS
2489 Brighton Henrietta Town Line Rd. Rochester, NY 14623

EIN/Tax ID: 161594988
DUNS: N/A
Number of Employees:
Woman-Owned: No
Minority-Owned: No
HUBZone-Owned: No