Transmitted Wavefront Metrology of Multiple-Layer Dome Optics Using a Scanning Low-Coherence Dual Interferometer (SLCDI)
Agency / Branch:
DOD / ARMY
We propose a scanning low-coherence dual interferometery system that can accurately measure the optical thickness of hemispheric optical domes used as missile windows. The system has the unique capability to measure the optical thicknesses of individual layers within domes composed of multiple materials. The optical thickness map created during the scanning process is directly related to the wavefront transmission properties of the dome.
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