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Year:1988
Company: Spire Corporation Agency/Program/Year/Phase: DOT / SBIR / 1988 / 1
Abstract: WITHOUT EFFECTIVE NONDESTRUCTIVE INSPECTION (NDI) MENTHODS, STRUCTURES EMPLOYING COMPOSITE MATERIALS MUST RELY ON LARGE DESIGN MARGINS OF SFETY AND EXPENSIVE INDIVIDUAL COMPONENT PROOF TESTING. OBJECTIVE OF THE PROPOSED PHASE I RESEARCH IS TO REMEDY THIS WITH GAMMA RAY SCATTERING COUNTING, A FORMOF… more
Company: Spire Corporation Agency/Program/Year/Phase: DOD / SBIR / 1988 / 1
Abstract: THIS PROPOSAL DEALS WITH THE DESIGN OF HIGH PULSED POWER DIODE LASER ARRAYS AND THE DEVELOPMENT OF FABRICATION TECHNIQUES FOR ACHIEVING SUCH ARRAYS. DURING THE FIRST PART OF THIS PHASE I EFFORT WE WILL CRITICALLY REVIEW EXISTING DESIGNS OF EDGE-EMITTING AND SURFACEEMITTING LASER ARRAYS. THERE HAS… more
Company: Spire Corporation Agency/Program/Year/Phase: DOD / SBIR / 1988 / 1
Abstract: ION IMPLANTATION IS AN EFFECTIVE PROCESS TO CREATE COMPRESSIVE STRESS IN THE SUBSURFACE REGIONS OF METALLIC COMPONENTS AND THEREBY ENHANCE THEIR RESISTANCE TO FATIGUE INITIATED FAILURES. ION IMPLANTATION OF LIGHT INTERSTITIAL IONS (SUCH AS BORON, CARBON OR NITROGEN) INTO TITANIUM-BASED ALLOYS (OR… more
Company: Spire Corporation Agency/Program/Year/Phase: DOD / SBIR / 1988 / 1
Abstract: THE PROPOSED RESEARCH WILL TEST THE FEASIBILITY OF REMOTELY MEASURING MECHANICAL STRAIN IN HOSTILE ENVIRONMENTS AND ON MOVING ENGINE PARTS OR OTHER STRUCTURES USING A SPECIAL LOW LEVEL RADIATION SOURCE PRODUCED BENEATH THE SURFACE. STRAIN ON THE PART IN QUESTION WILL CHANGE THE ATTENUATION OF… more
Company: Spire Corporation Agency/Program/Year/Phase: DOD / SBIR / 1988 / 1
Abstract: NEW CERAMIC POLYCRYSTALLINE SUPERCONDUCTING MATERIALS SUCH AS YBA(2)CU(3)O(7) ARE NOT STABLE, SHOWING BOTH LOSS OF OXYGEN AND RAPID DEGRADATION OF PROPERTIES IN AIR AS CHEMICAL REATIONS REMOVE BARIUM FROM THE TRINARY METAL OXIDE CRYSTAL LATTICE, CREATING MORESTABLE BINARY METAL OXIDE COMPOUNDS. THE… more
Company: Spire Corporation Agency/Program/Year/Phase: DOD / SBIR / 1988 / 1
Abstract: CREATION OF BURIED INSULATING LAYERS IN SILICON WAFERS BY HIGH DOSE OXYGEN IMPLANTATION (SIMOX) HAS GAINED SIGNIFICANT ATTENTION IN THE LAST TWO YEARS. THE SIMOX TECHNOLOGY IS POSITIONED TO BE A PRIME CONTENDER IN THE SILICON-ON-INSULATOR (SOI) ARENA MAINLY BECAUSE OF THE INHERENT… more
Company: VISION RESEARCH CORPORATION Agency/Program/Year/Phase: HHS / SBIR / 1988 / 1
Abstract: THE LONG RANGE OBJECTIVE OF THE PROPOSED RESEARCH IS TO APPLY IMAGE PROCESSING TECHNOLOGY TO THE DEVELOPMENT OF AN AUTOMATED OPHTHALMIC INSTRUMENT THAT WILL RAPIDLY MEASURE THE ALIGNMENT OF BOTH EYES IN PRIMARY GAZE AND QUANTITATIVELY DETERMINE PHORIAS AND TROPIAS FOR THE OPHTHALMOLOGIST, THE… more
Company: IMMUNOMEDICS, INC. Agency/Program/Year/Phase: HHS / SBIR / 1988 / 2
Abstract: THE CONTINUING DEVELOPMENT AND EVALUATION OF NEW RADIOCHELATION AGENTS ARE OF UTMOST IMPORTANCE IN TUMOR IMAGING WITH ANTICANCER ANTIBODIES. WHILE DTPA-LABELED IN-111-RADIOIM-MUNOPHARMACEUTICALS ARE WIDELY USED AS TUMOR IMAGING AGENTS, THEIR HIGH LIVER BACKGROUND IS A DISADVANTAGE IN PROVIDING A… more
Company: Empirical Technologies Corporation Agency/Program/Year/Phase: DOD / SBIR / 1988 / 1
Abstract: N/A
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