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Associated Particle Imaging Shipboard Inspection System

Award Information
Agency: Department of Homeland Security
Branch: N/A
Contract: NBCHC040092
Agency Tracking Number: 04110056
Amount: $100,000.00
Phase: Phase I
Program: SBIR
Solicitation Topic Code: N/A
Solicitation Number: N/A
Solicitation Year: N/A
Award Year: 2004
Award Start Date (Proposal Award Date): N/A
Award End Date (Contract End Date): N/A
Small Business Information
21311 Hawthorne Blvd. Suite 300
Torrance, CA 90503
United States
HUBZone Owned: No
Woman Owned: No
Socially and Economically Disadvantaged: No
Principal Investigator
 G. Minot Clements
 Program Manager
 (703) 841-0990
Business Contact
 Paula Cline
Title: Vice President
Phone: (310) 543-5433
Research Institution

Dynamics Technology, Inc. (DTI) will develop a man-portable shipboard inspection system based on Associated Particle Imaging (API) technology, which can provide through-wall imaging behind bulkheads and within containers, along with automated threat material identification. The system builds on a decade of research by DTI and its partners, encompassing explosives identification, current government-sponsored R&D for related API applications, and recent progress in commercial components that supports rugged cost-effective systems development. Associated particle imaging is a neutron imaging technique that is particularly well suited to shipboard inspection because of its unique capability to provide: (1) man-portable inspection capability, (2) 3-D imagery to greatly enhance clutter suppression and improve automated material identification; and (2) penetration of steel bulkheads at high SNR. In Phase I, DTI will define operational requirements, perform an analytical feasibility assessment, provide supporting API measurements to validate the concept, identify advanced component tradeoffs, and define Phase II R&D requirements. In Phase II, we will develop advanced components and processing technology needed to achieve the functional and operational goals of a shipboard inspection system.

* Information listed above is at the time of submission. *

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