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Chemical Analyzer System for In Situ and Real Time Surface Monitoring for Composition Control During Synthesis of Compound Semiconductor Films

Award Information
Agency: Department of Defense
Branch: Army
Contract: W911NF-13-P-0021
Agency Tracking Number: A13A-011-0305
Amount: $149,826.00
Phase: Phase I
Program: STTR
Solicitation Topic Code: A13A-T011
Solicitation Number: 2013.A
Solicitation Year: 2013
Award Year: 2013
Award Start Date (Proposal Award Date): 2013-09-26
Award End Date (Contract End Date): 2014-03-17
Small Business Information
101 Stafford Court
Williamsburg, VA -
United States
DUNS: 932812928
HUBZone Owned: No
Woman Owned: No
Socially and Economically Disadvantaged: No
Principal Investigator
 Philippe Staib
 Director R&D
 (757) 565-7000
Business Contact
 Lillyan Dylla
Title: Treasurer
Phone: (757) 565-7000
Research Institution
 Univ of NY at Stony Brook
 Gregory Belenky
Dept. of Elec.&Comp. Eng. 273 Light Engineering
Stony Brook, NY 11794-2350
United States

 (631) 632-8397
 Nonprofit College or University

The overall objective of this proposal is to evaluate the new in-situ growth monitoring system, Auger Probe, in an MBE environment for reliable and reproducible, highly precise results. State-of-the art data manipulation techniques will be used without impacting the growth process (MBE in this case). Using Auger Electron Spectrometry (AES), the Probe system will be used for in situ, real time analysis and control of surface elemental compositions during MBE growth of compound semiconductor materials. Demonstrations will be performed on III-V compounds [such as (Al,In,Ga)(As,Sb)], but the methods will be developed in such a way that they could be adapted to other materials systems.

* Information listed above is at the time of submission. *

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