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HIGH ACCURACY CHARACTERIZATION OF MONOLITHIC MILLIMETER-WAVEDEVICES

Award Information
Agency: National Aeronautics and Space Administration
Branch: N/A
Contract: N/A
Agency Tracking Number: 5031
Amount: $49,737.00
Phase: Phase I
Program: SBIR
Solicitation Topic Code: N/A
Solicitation Number: N/A
Timeline
Solicitation Year: N/A
Award Year: 1987
Award Start Date (Proposal Award Date): N/A
Award End Date (Contract End Date): N/A
Small Business Information
P.o. Box 2015
Beaverton, OR 97075
United States
DUNS: N/A
HUBZone Owned: No
Woman Owned: No
Socially and Economically Disadvantaged: No
Principal Investigator
 () -
Business Contact
 Eric W. Strid
Phone: () -
Research Institution
N/A
Abstract

MAKING ACCURATE ON WAFER MEASUREMENTS OF MILLIMETER WAVE SEMICONDUCTOR DEVICES AND CIRCUIT ELEMENTS IS A FUNDAMENTAL REQUIREMENT FOR THE ADVANCEMENT OF MILLIMETER WAVE TECHNOLOGY. MILLIMETER WAVE WAFER PROVE DEVELOPMENT IS REQUIRED. PRESENTLY ON-WAFER PROBING IS AVAILABLE ONLY TO 26.5 GHZ. HOWEVER, SIGNIFICANT INNOVATIONS ARE REQUIRED TO EXTEND THIS CAPABILITY TO HIGHER FREQUENCIES. THIS WORK INVESTIGATES THE FEASIBILITY OF OVERCOMING PROBLEMS IN THE MILLIMETER WAVE BANDS. PHASE ONE RESULTS IN PROTOTYPES OF DC TO 50 GHZ WAFER PROBES AND MEASUREMENT CALIBRATION STANDARDS FOR THE MEASUREMENT OF ACTIVE MILLIMETER WAVE DEVICES ON-WAFER. THESE RESULTS WILL PROVIDE A BASIS TO ACHIEVE UP TO 110 GHZ PERFORMANCE IN LATER WORK.

* Information listed above is at the time of submission. *

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