HIGH EFFICIENCY COMPACT MODELING OF RADIATION EFFECTS

The objective of this research is prove the feasibility of automatically migrating radiation effects predicted in TCAD level tools to compact modeling tools. This transition will enable compact models that possess radiation effects to be quickly generated, which can then be used in circuit design activity. This "model-in-a-day" approach is a substantial improvement over the current ad hoc approaches. Lynguent will develop and demonstrate model-based design tools for systematically supporting the rapid deployment of radiation-enhanced compact models including the vital step of model validation. The intent is for these modeling and verification tools to be "added-on" as third party tools to existing commercial simulators, TCAD tools, and design environments promoting their rapid adoption and widespread use. The desire is to provide a standardized approach for modeling and collaborative design independent of the underlying design environment. Phase I will focus on radiation effects in 65 nm technology. We will investigate the prevalent radiation effects at this process node, modify a TCAD model to predict the effects on the device, and then demonstrate how these effects can be transitioned to compact models. Phase II will consist of expanding this work and fully automating this capability in a general sense using commercial applications.